Device for verifying performance of test board used for C-waveband GaN microwave power device

Abstract

The invention discloses a device for verifying the performance of a test board used for a C-waveband GaN microwave power device. The device is characterized by comprising a cooling base, the test board and a test device; the test board is welded to the cooling base; the welding mode is adopted by both the input end and the output end of the test board, and the input end and the output end of the test board are fixedly grounded through screw spikes; a passive component is welded to the test board. The device has the advantages that the cooling base is a copper base and can enhance the electrical characteristic and the heat dissipation characteristic; the test board and the cooling base are connected in a welded mode, so that the grounding performance under the C-waveband frequency is facilitated; the test device is packaged through RF2417SPC-E, and the packaging mode of the device is the same with the packaging mode of the C-waveband GaN microwave power device, so that matching errors caused by different packaging modes are reduced as much as possible. The whole device is simple in structure, interference of all external factors is avoided as much as possible, detection accuracy is improved, the cost is low, and operation is easy.

Description

technical field [0001] The invention relates to a device for verifying the performance of a test board for a C-band GaN microwave power device, and belongs to the technical field of microwave power device detection. Background technique [0002] The test board is a test method for evaluating the performance of C-band microwave power devices. However, in the testing process, if the performance of the test board itself deviates, it will cause deviations in the evaluation of the performance of microwave power devices, which will not only fail to reflect the real performance of microwave power devices, but may also make the promising microwave power itself Devices are buried because of poor test results, which greatly hinders the development of this field. Contents of the invention [0003] In order to solve the deficiencies of the prior art, the object of the present invention is to provide a device that can accurately verify the performance of a test board for C-band GaN mi...

AI Technical Summary

Problems solved by technology

However, in the testing process, if the performance of the test board itself deviates, it will cause deviations in the evaluation of the performance of microwave power devices, which will not only fail to reflect the real performance of microwave power devices, but may also make the promising microwave power itself Devices are buried because of poor test results, greatly hindering the development of this field

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