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General testing system

A general-purpose test and data technology, applied in the field of test system research, can solve problems such as poor versatility, and achieve the effect of reasonable design, good versatility, and reasonable test system design

Inactive Publication Date: 2015-03-25
CHENGDU SHENGJUN ELECTRONICS EQUIP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention provides a universal test system, which solves the technical problem of poor universality in the test system in the prior art, and realizes the technical effect of reasonable test system design and good universality

Method used

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  • General testing system

Examples

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Embodiment 1

[0025] In Embodiment 1, a general test system is provided, please refer to figure 1 , the system includes:

[0026] A real-time processing unit 1 and a non-real-time processing unit 2, wherein the real-time processing unit is used to collect data, and perform data collection and data time stamping of the data bus interface according to a preset sampling period, and communicate with the The data interface of the non-real-time processing unit uploads the data processed by the time stamp to the management platform for analysis and processing by the host computer. During the waveform output process, the real-time processing unit installs the preset cycle to download the data from the host computer Send out through the data bus interface to realize the output of preset waveform data;

[0027] The non-real-time processing unit is a WINDOWS platform based on X86 architecture, runs test software, and provides a GUI interface for users.

[0028] Wherein, in the embodiment of the pres...

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Abstract

The invention discloses a general testing system. The system comprises a real-time processing unit and a non-real-time processing unit, wherein the real-time processing unit is used for acquiring data and conducting data acquisition and data time scale marking on a data bus interface according to a preset sampling period, data obtained after time scale processing are uploaded to a management platform through the real-time processing unit and a data interface of the non-real-time processing unit and are analyzed and processed through an upper computer, and in the waveform output process, the real-time processing unit transits the data downloaded by the upper computer outwards through the data bus interface according to the preset period so that preset waveform data can be output; the non-real-time processing unit is a WINDOWS platform based on an X86 architecture and is used for operating testing software and providing a GUI for a user; the technical effects of reasonable design and good universality of the testing system are achieved.

Description

technical field [0001] The invention relates to the field of test system research, in particular to a general test system. Background technique [0002] The test system is used to perform functional or experimental tests on devices and other systems, so as to conduct test experiments on devices and systems, obtain research data, test stability and accuracy, etc., and assist people to complete their work. [0003] In the prior art, the test system usually can only test a specific device or system when performing tests, and different devices and systems require different test systems for testing, which has poor versatility. [0004] To sum up, in the process of realizing the technical solution of the invention in the embodiment of the present application, the inventor of the present application found that the above-mentioned technology has at least the following technical problems: [0005] In the prior art, because the test system usually can only test for a specific device ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D21/00
Inventor 肖燕荣彬杰
Owner CHENGDU SHENGJUN ELECTRONICS EQUIP
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