A Fault Injection Apparatus for Verifying System-Level Single Event Soft Error Protection Capabilities

Abstract

The invention discloses a fault injection device for verifying system level single particle soft error protection ability. The fault injection device is installed between a fault injection target single machine and other single machines in the system. According to the record of fault case, a low frequency interface fault injection module and a high frequency interface fault injection module inject faults to the low frequency interface data and high frequency interface data which are sent to other single machines in the system by a target fault injection single machine. A system protection response module notifies the fault injection control module to stop fault injection operation and controls the low frequency interface fault injection module and the high frequency interface fault injection module to response when monitoring that other single machines in the system send fault recovery operation data to the fault injection target single machine. The fault injection device for verifying level single particle soft error protection ability of system is versatile. Special design according to different objects of different faults is not needed, and then the workload is greatly reduced. Also the response to the fault recovery operation is added, and the fault injection device for verifying system level single particle soft error protection ability provides basis to fault protective ability of real time and interrupt time indicator assessment system.

Description

technical field [0001] The invention relates to the technical field of system-level space single-event soft-error protection capability verification, in particular to a fault injection device for verifying system-level single-event soft-error protection capability. Background technique [0002] When a digital circuit is applied in a space environment, space high-energy particles will penetrate the interior of the semiconductor device and generate ionization on the path, and the circuit nodes will absorb the electrons and holes generated by the ionization, resulting in circuit errors. This effect is called single event effect . There are mainly radiation experiment methods and simulation methods for simulating single event effects on the ground. The radiation experiment method is expensive and has a long cycle, while the simulation method is low in cost and easy to implement. It has become the main means for verifying the resistance of spacecraft systems to single event effec...

AI Technical Summary

Problems solved by technology

The invention can be used to verify the capability of the spacecraft system-level single-event soft-error fault protection

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