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Probabilistic fatigue life prediction using ultrasonic inspection data considering eifs uncertainty

A fatigue life and probability technology, used in material analysis using sonic/ultrasonic/infrasonic waves, processing response signals of detection, measurement devices, etc., can solve problems such as systematic methods that rarely provide uncertainty quantification

Inactive Publication Date: 2015-04-01
SIEMENS AG
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, for EIFS derived from ultrasonic flaw detection data using the DGS method, few reported studies provide a systematic approach for unambiguous uncertainty quantification

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  • Probabilistic fatigue life prediction using ultrasonic inspection data considering eifs uncertainty
  • Probabilistic fatigue life prediction using ultrasonic inspection data considering eifs uncertainty
  • Probabilistic fatigue life prediction using ultrasonic inspection data considering eifs uncertainty

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Embodiment Construction

[0028]Exemplary embodiments of the invention as described herein generally include a probabilistic fatigue life prediction system using ultrasonic non-destructive examination (NDE) data, and while the invention encompasses numerous modifications and alternative forms, specific embodiments of which are shown by way of example in the drawings , and describe in detail in the text. It should be understood, however, that there is no intention to limit the invention to the particular forms disclosed, but on the contrary, the invention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.

[0029] As used herein, the term "image" refers to multidimensional data composed of discrete image elements (eg, pixels for two-dimensional images and voxels for three-dimensional images). For example, an image may be a medical image of a subject acquired by computed tomography, magnetic resonance imaging, ultrasound, or any other medica...

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Abstract

A method for probabilistically predicting fatigue life in materials includes sampling (41) a random variable for an actual equivalent initial flaw size (EIFS), generating (42) random variables for parameters (InC, m) of a fatigue crack growth equation [Formula should be inserted here] from a multivariate distribution, and solving (43) the fatigue crack growth equation using these random variables. The reported EIFS data is obtained by ultrasonically scanning a target object, recording echo signals from the target object, and converting echo signal amplitudes to equivalent reflector sizes using previously recorded values from a scanned calibration block. The equivalent reflector sizes comprise the reported EIFS data.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to Guan et al., U.S. Provisional Application Serial No. 61 / 620,087, entitled "Probabilistic Fatigue Life Prediction Using Ultrasonic Inspection Data Considering EIFS Uncertainty," filed April 4, 2012, the The entire contents are hereby incorporated by reference. technical field [0003] This application relates to probabilistic fatigue life prediction methods using ultrasonic non-destructive examination (NDE) data. Background technique [0004] Fatigue crack growth is a common cause of failure for most brittle materials subjected to stress loading. For critical structural components, fatigue crack flaws need to be identified and accurately quantified to enable repair and maintenance of components to avoid catastrophic events. For reliable damage identification, non-destructive testing is an available technique. For large-scale structural components, such as generator rotors and turbi...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N29/44G01N17/00
CPCG01N29/4472G01N17/00G01N2203/0218G01N2291/0258G01N29/44G06F17/10G01N29/4418
Inventor 关雪飞张竞丹K.卡德奥周少华
Owner SIEMENS AG