A method for decompressing compressed data

A technology for compressing and decompressing data, applied in electrical components, code conversion, etc., and can solve problems such as irrational number restoration, inability to complete large data square root operations, and expansion of irrational numbers into decimals.

Active Publication Date: 2017-02-15
SHANGHAI TAIYU INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, there is a problem of how to restore the irrational numbers to the original test set in this technology. The difficulty is how to expand the irrational numbers into decimals
Using traditional methods, computers cannot complete the square root operation of big data

Method used

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  • A method for decompressing compressed data
  • A method for decompressing compressed data
  • A method for decompressing compressed data

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Embodiment Construction

[0015] The embodiments of the present invention are described in detail below. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following implementation example.

[0016] This embodiment includes the following steps:

[0017] (1) Transform the storage of the original test data into offline storage of one or several corresponding irrational numbers; (2) During the test, first estimate the single-precision or double-precision decimals corresponding to the irrational numbers by an ordinary computer connected to the automatic test equipment , the number of digits corresponding to the decimal number of the irrational number does not include the integer part as k digits, and the corresponding decimal number is b 0 .b 1 b 2 …b k , where b 0 , b 1 , b 2 ,...,b k For the corre...

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Abstract

The invention discloses a decompression method for compressed data. Storage of whole original test data is converted into storage of irrational numbers; in the test process, firstly, a common computer connected with automatic test equipment estimates single-precision or double-precision decimals corresponding to the irrational numbers, the length of runs corresponding to an integer part and front k-bit decimal parts is converted into test vectors, and then the test vectors are sequentially input to a detected chip through an ATE channel; the runs represented by the k+1 bit are converted into test vectors according to the formula shown in the specification, and then the test vectors are input to the detected chip through the ATE channel till k reaches the pre-calculated number of the runs corresponding to the original test data length; the test result is compared with a theoretical value, if the result is identical with the theoretical value, the detected chip passes a test, and if the result is not identical with the theoretical value, the detected chip does not pass the test. An extraction operation is converted into simple operations such as addition, subtraction, multiplication and division through a quadratic sum formula, the complex operation is simplified, squares of big data are converted into decimals, and restoration of the dynamic code compression technology is achieved.

Description

technical field [0001] The invention relates to a method for restoring compressed test data in an external built-in self-test method for a system chip, in particular to a method for decompressing compressed data. Background technique [0002] With the increase of the scale of integrated circuits, the huge amount of test data has become one of the main problems affecting the test of integrated circuits. The ITRS report shows that in 2019, testing a chip requires 20,370 test patterns, which is 240 times the number of 85 test patterns that need to be tested in 2009; 150 times the compression ratio of 80. [0003] The research on test data compression technology mainly focuses on three aspects: test set compression (Test SetCompaction), built-in self-test (Built-in Self-Test, BIST) and static code compression. (1) The test set is compressed. This technology refers to reducing the number of test vectors by compressing some test cubes with don't carebits (Don't carebits) under ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03M7/30
Inventor 詹文法
Owner SHANGHAI TAIYU INFORMATION TECH
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