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Detection of x-ray radiation and x-ray detector systems

A detector system, X-ray technology, applied in radiation measurement, X/γ/cosmic radiation measurement, radiation intensity measurement, etc., can solve the problem that it is impossible to definitely reverse the X-ray quantum

Active Publication Date: 2017-12-15
SIEMENS HEALTHCARE GMBH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

As a result, it is not possible to unambiguously back-calculate the energy or the number of absorbed x-ray quanta, so that these detectors can only be used with great expense for reliable use in imaging applications such as computed tomography

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  • Detection of x-ray radiation and x-ray detector systems
  • Detection of x-ray radiation and x-ray detector systems
  • Detection of x-ray radiation and x-ray detector systems

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Embodiment Construction

[0069] As explained at the outset, X-ray detectors based on direct conversion semiconductor materials such as cadmium telluride, cadmium zinc telluride, in particular detectors for computed tomography systems suffer from time on the instability. In particular, the detection signal changes over time with a practically constant excitation with x-ray radiation. This is undesirable and leads to artifacts in the imaging, so that this detector with its current performance can only be used with difficulty in x-ray-based imaging methods. By irradiating the semiconductor detector material so many free charge carriers can be generated that a stable state can be established and the polarization effects explained at the outset can be neutralized or stabilized. The stabilized measurement signal or detector signal required for measuring the x-ray radiation is thereby ensured, which enables use in medical imaging. However, in the case of sensor materials or semiconductor detector elements ...

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Abstract

The invention relates to a method for detecting X-ray radiation (R) with an X-ray detector (100) having direct-switching semiconductor detector elements (150a, 150b), wherein by means of a radiation source ( 210a, 210b) deliver the additional radiation (K) to the semiconductor detector elements (150a, 150b), and the delivery of the additional radiation (K) is controlled or regulated based on predetermined setpoint values ​​(Ta, Tb, Tc). In particular, setpoint values ​​can be specified variable over time as a sequence of target values. Furthermore, an x-ray detector system ( 200 ) is described with which the method can be carried out.

Description

technical field [0001] The invention relates to a method for detecting x-ray radiation, an x-ray detector, an x-ray detector system and a computed tomography with a direct conversion semiconductor detector element for detecting x-ray radiation system. Background technique [0002] For detecting X-ray radiation, different detector systems are known. For example, scintillation crystal detectors are widely used in order to be able to detect the flux density of x-ray radiation occurring in the field of computed tomography. The scintillation crystal detector firstly converts the X-ray radiation photochemically into photons which have a suitable energy in order to enable detection of the photons by means of semiconductor diodes (photodiodes), for example. [0003] Furthermore, for computed tomography, efforts are being made to use so-called direct-conversion semiconductor detection elements, which absorb the X-ray radiation in the semiconductor material without prior energy conv...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/24
CPCG01T1/24G01N23/046G01T1/026G01T1/244
Inventor E.戈德尔D.尼德洛纳M.斯特拉斯伯格S.沃思P.哈肯施密德S.卡普勒B.克赖斯勒M.拉巴延德英扎M.莱因万德C.施勒特
Owner SIEMENS HEALTHCARE GMBH
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