Detection of x-rays, and x-ray detector system
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SIEMENS HEALTHCARE GMBH
- Publication Date
- 2015-05-20
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Abstract
Description
technical field
[0001] The invention relates to a method for detecting x-ray radiation, an x-ray detector, an x-ray detector system and a computed tomography with a direct conversion semiconductor detector element for detecting x-ray radiation system. Background technique
[0002] For detecting X-ray radiation, different detector systems are known. For example, scintillation crystal detectors are widely used in order to be able to detect the flux density of x-ray radiation occurring in the field of computed tomography. The scintillation crystal detector firstly converts the X-ray radiation photochemically into photons which have a suitable energy in order to enable detection of the photons by means of semiconductor diodes (photodiodes), for example.
[0003] Furthermore, for computed tomography, efforts are being made to use so-called direct-conversion semiconductor detection elements, which absorb the X-ray radiation in the semiconductor material without prior energy conv...