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Method of testing flat panel displays and system configured to test flat panel displays

A display and panel technology, applied to measuring devices, static indicators, instruments, etc., can solve the problems that the display does not work, does not produce images, etc.

Active Publication Date: 2019-05-10
ORBOTECH LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Likewise, a significant portion of the manufacturing costs associated with OLED displays occurs when the organic light emitting diode (OLED) material is deposited on the TFT backplane
A problem with inspecting LCD or OLED panels prior to depositing LC or OLED materials is that without LC or OLED materials, the display is non-functional and does not produce an image for inspection

Method used

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  • Method of testing flat panel displays and system configured to test flat panel displays
  • Method of testing flat panel displays and system configured to test flat panel displays
  • Method of testing flat panel displays and system configured to test flat panel displays

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Embodiment Construction

[0023] According to one embodiment of the present invention, a method includes an inspection technique for a TFT display panel including an integrated driver circuit. figure 1 Depicts an array region 102 (hereinafter also referred to as "pixel" in a panel being tested using a plurality of signal lines 150, 152, 154, 156, a plurality of shorting bars 1082, 1081, and a VIOS test head 103 according to one embodiment of the present invention. Array"), the VIOS test head 103 is placed above the array area 102. The panel further includes an IGD circuit 104 disposed in the periphery of the array region 102 at one or both ends of the gate line ( figure 1 Illustrating the IGD region on one side of the active region). The IGD circuit 104 may be coupled to a first signal line 150, a second signal line 152, a third signal line 154, and a first signal line 150, a second signal line 152, a third signal line 154, and a first signal line 150, which may be used to supply the clock signal CK...

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Abstract

The present application relates to a method of testing flat panel displays and a system configured to test flat panel displays. A method of testing a flat panel display including an array of pixels and peripheral circuitry configured to provide signals to the pixels is disclosed. The method includes applying at least one test signal to the peripheral circuitry; acquiring one or more voltage images of the peripheral circuitry; and detecting defects in the peripheral circuitry based on the acquired voltage images.

Description

[0001] Related Application Cross Reference [0002] This application claims the benefit of U.S. Provisional Application No. 61 / 888,731, filed October 9, 2013, and is related to commonly assigned U.S. Patent No. 7,714,589, filed November 14, 2006, U.S. No. 7,714,589 The patent claims priority to commonly assigned US Provisional Application No. 60 / 737,090, filed November 15, 2005, the contents of each of which are incorporated herein by reference in their entirety. technical field [0003] The present invention relates generally to inspection of thin film transistor (TFT) arrays used in liquid crystals, organic light emitting diodes, and related displays, and more particularly to inspection of TFT arrays including integrated driver circuits. Background technique [0004] A significant portion of the manufacturing costs associated with liquid crystal display (LCD) panels occurs when liquid crystal (LC) material is injected between the upper color filter and the lower TFT backp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00
CPCG01R19/16576G01R23/16G01R31/2825G09G3/006
Inventor 李昶熙李满濬金成镇李钟浩迈克尔·肖恩·卡萨迪尼科莱·莫基夫肯特·阮丹尼尔·托特
Owner ORBOTECH LTD