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Substrate detection system

A substrate detection and substrate technology, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as the inability to meet the competitive needs of rapid and high-quality production, and achieve the effect of improving detection efficiency

Inactive Publication Date: 2015-07-22
YOUNGTEK ELECTRONICS
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Problems solved by technology

[0003] The main purpose of the present invention is to provide a substrate detection system, which utilizes the carrier device to quickly load the substrate, and cooperates with the first substrate adsorption stage to effectively position the substrate, so that the first detection device can accurately The detection of ground-related circuit wires can further solve the problem that the known technology cannot quickly and accurately detect substrate-related wires by manual labor, and cannot meet the competitive needs of fast and high-quality production

Method used

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Examples

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no. 1 example 〕

[0089] Please also refer to Figure 1 to Figure 7 , which is a schematic diagram of the first embodiment of the substrate inspection system of the present invention. Such as figure 1 As shown, the substrate inspection system 1 includes: a loading device 10 , a carrying device 20 , a first substrate adsorption stage 30 and a first inspection device 40 . The material placement device 10 includes a first substrate placement area 11 and a second substrate placement area 12; for example, the first substrate placement area 11 can place the substrate A to be detected, and the second substrate placement area 12 It may be to place the inspected substrate A, and in practical application, it may be based on the detection result of the first inspection device 40 to design, for example, a substrate re-inspection area, a substrate damage area, and the like. The first substrate placement area 11 and the second substrate placement area 12 can be respectively provided with a movable platform...

no. 2 example

[0102] Please also refer to Figure 8 and Figure 9 , which is a schematic diagram of the second embodiment of the substrate inspection system of the present invention. Such as Figure 8 As shown, the substrate detection system 2 includes: a material placement device 10, a carrier device 20, a first substrate adsorption stage 30, a first detection device 40, a second substrate adsorption stage 50, and a substrate turnover device 60 and a second detection device 70 . The relevant connection relationship of the material placement device 10 , the carrying device 20 , the first substrate adsorption stage 30 and the first detection device 40 is the same as that of the foregoing embodiments, so no further description is given here. This embodiment specifically illustrates that the substrate inspection system 2 may further include a second guide rail 500 arranged parallel to the first guide rail 300, and the second substrate adsorption carrier 50 is movably arranged on the second ...

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Abstract

A substrate detection system comprises a placing device, a carrying device, a first substrate absorption carrier, and a first detection device. The placing device is used for placing at least one substrate. The carrying device is used for carrying the substrate placed on the placing device. The first substrate absorption carrier is movably arranged on a first guide rail to absorb the substrate placed by the carrying device. The first detection device is used for detecting the substrate arranged on the first substrate absorption carrier. Thus, the substrate can be detected quickly and effectively. By adopting the substrate detection system of the invention, the detection efficiency and effect of substrates can be effectively improved, and the competition requirement for quick and high-quality production can be achieved.

Description

technical field [0001] The invention relates to a substrate detection system, in particular to a substrate detection system capable of rapidly and accurately detecting a substrate. Background technique [0002] The inspection of finished circuit boards is an important link in the production process, and the most important thing in the inspection of finished products is the inspection of electrical wires. The traditional circuit board test needs to rely on the manual operation of the operator. For those circuit boards with relatively simple circuits and relatively few test signals, manual operation can still meet the requirements. However, with the advancement of electronic technology, the circuits are becoming more and more complex. There are more and more test signals, the life cycle of products is getting shorter and shorter, and there are more tasks for small batches and multi-variety products. The manual circuit board testing method is not only inefficient, but also pron...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 汪秉龙陈桂标陈信呈彭及盈郑明志
Owner YOUNGTEK ELECTRONICS
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