Method for identifying single-particle protective weak spots of spacecraft system

An identification method and single-particle technology, applied in the fields of instruments, special data processing applications, electrical digital data processing, etc., can solve problems such as the inability to assess the consequences and degree of harm of single-particle protection, and the inability to identify weak links in single-particle protection. sexual effect

Active Publication Date: 2015-08-05
BEIJING INST OF SPACECRAFT SYST ENG
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method can only calculate the single event turnover rate, and cannot evaluate the consequences and degree of harm caused by single event soft errors, let alone effectively identify the weak link of single event protection in the spacecraft system design

Method used

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  • Method for identifying single-particle protective weak spots of spacecraft system
  • Method for identifying single-particle protective weak spots of spacecraft system
  • Method for identifying single-particle protective weak spots of spacecraft system

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Experimental program
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Embodiment

[0058] It is known that for a certain satellite, the working life requirement is 10 years (87600 hours), and the number of interruptions caused by single-event soft errors per year is 3 times. The devices interrupted by the satellite are device S, device D and device R. Device S and device D both use the single event sensitive device FPGA, and the single event soft error failure mode, consequence type, system recovery strategy and basic data are shown in the following table.

[0059]

[0060] According to the method proposed by the present invention, the impact of computing device S and device D on the entire star system is shown in the table below.

[0061]

[0062]

[0063] According to the requirements of satellite life and outage indicators, the weak point threshold of satellite single event soft error protection is

[0064] T CL = 3 × 5 3 ...

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Abstract

A method for identifying single-particle protective weak spots of a spacecraft system relates to equipment which uses a single-particle soft error sensitive device such as an FPGA and a DSP to evaluate tasks or functions of the spacecraft system, and identification of single-particle protective weak spots of the spacecraft system, wherein the method comprises the steps as follows: studying consequence, incidence probability and persistent period of a single-particle soft error influence by using the incidence probability of the single-particle soft error as an input, and establishing a single-particle soft error harm time model. The method of the invention realizes the quantitative evaluation of the influence to a single-particle soft error system of the spacecraft so as to accurately identify the single-particle protective weak spots to provide evidence for effectively improving single-particle protective design of the spacecraft.

Description

technical field [0001] The invention relates to a method for evaluating the impact of a recoverable fault on the system, in particular to a method for quantitatively evaluating the impact on a spacecraft system when a single event soft error occurs in a device using single event soft error sensitive devices such as FPGA and DSP and ways to identify weak points. Background technique [0002] Spacecraft such as satellites operating in the earth's space orbit face the environment of high-energy protons and heavy ions from the Earth's radiation belts, galactic cosmic rays, and solar cosmic rays. These high-energy particles can produce single-event effects in the microelectronic devices used in satellites. Typical It is a single-event soft error that causes electronic system logic disorder, instruction error, function interruption, logic anomaly, etc., thereby affecting the normal function and service of the satellite. [0003] Single event soft errors have an important impact o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 赵海涛张兆国郑晋军吕欣琦谷岩
Owner BEIJING INST OF SPACECRAFT SYST ENG
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