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Drop height fitting method

A critical drop height and height technology, applied in the direction of strength characteristics, measuring devices, instruments, etc., can solve problems such as increased workload, material variability, test results deviation, etc., to improve efficiency, improve test efficiency, and facilitate local modification. Effect

Inactive Publication Date: 2018-02-02
中华人民共和国昆山出入境检验检疫局 +1
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Problems solved by technology

Therefore, the legality of the test sampling point must be judged after the critical drop height is solved. If the sampling point is found to be illegal, it must be re-sampled and the HIC-drop height curve drawn. This step will increase the workload and be tested at the same time. Under the action of repeated impact, certain material denaturation may occur, which may lead to the deviation of test results

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Embodiment Construction

[0034] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0035] In order to achieve the purpose of the present invention, as figure 1 As shown, in one of the embodiments of the present invention, a drop height fitting method is provided, comprising the following steps:

[0036] S1. Maintenance of effective test point list: the drop test machine performs impact test, obtains the drop data of the impact test point and generates a list of test points, and performs conflict analysis when adding the drop data of the new impact test point to the generated test point list. If there is no conflict, generate a new effective test point list and enter step S2, if conflict, delete the conflict point according to the conflict judgment rules, generate a new effective test point list and enter step S2;

[0037] S2. Determine whether cubic B-spline fitting is possible: judge whether more than four effective test ...

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Abstract

The invention discloses a drop height fitting method, which comprises the following steps: maintaining the list of effective test points; determining whether the three-time B-spline fitting is possible, and then performing three-time B-spline fitting or drop test guidance; solving the critical drop height; Determines whether a valid critical drop height has been achieved, then outputs the result or a drop test guide. The invention deletes the conflict points according to the conflict judgment rules to obtain effective test points, which is convenient for fast three-time B-spline fitting and improves test efficiency; at the same time, the three-time B-spline curve is used to perform curve fitting on effective test points to realize The rapid solution of the critical drop height further improves the efficiency of the test; the drop test guide adopts the method of successive approximation for test guidance, and prompts possible suitable test points for testing, thereby improving the efficiency of the test.

Description

technical field [0001] The invention relates to a drop height fitting method. Background technique [0002] In the standard EN 1177-2008 "Shock-absorbing playground paving. Determination of critical drop height", a manual drawing solution method for critical drop height (HIC=1000) is given. This method has great inaccuracy, typical examples are figure 1 as shown, figure 1 Among them, m is the impact test point, H is the drop height, HIC is the critical drop height, and the point corresponding to HIC=1000 in the curve is the critical point. The drawing of the curve in the drawing process and the search for the critical drop height depend entirely on the tester’s experience, familiarity with the test, and to a certain extent also related to the psychology of the test, so the results are very random and cannot be tested. recurrent. [0003] At the same time, the standard requires that for a drop test result, at least two HIC values ​​must be below 1000, and at least two HIC...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/303
Inventor 许斌周利英骆海清张学锋蔡建和钱烈辉刘辉强
Owner 中华人民共和国昆山出入境检验检疫局
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