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A method and device for analyzing pcie eye diagram

An eye diagram and technology to be analyzed, applied in the electronic field, can solve problems such as long waiting time, complicated interface, cumbersome operation process, etc., and achieve the effect of reducing workload, avoiding mistakes, and improving work efficiency

Active Publication Date: 2018-06-26
上海浪潮云计算服务有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the SigTest eye diagram analysis tool has a complex interface and an extremely cumbersome operation process. It is necessary to manually load waveforms and template files repeatedly. Especially in the case of large data volumes, engineers need to spend a lot of time and energy on repeated operations. The waiting time is long, and the engineer needs to wait for the analysis to be completed and load the waveform file again, during which it is difficult to do other work
However, PCIe eye diagram verification is one of the most basic verification items in system signal integrity verification, and a large amount of PCIe eye diagram verification work is often encountered

Method used

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  • A method and device for analyzing pcie eye diagram
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  • A method and device for analyzing pcie eye diagram

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Embodiment Construction

[0037] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0038] A flow chart of a specific embodiment of the method for analyzing the PCIe eye diagram provided by the present invention is as figure 1 As shown, the method includes:

[0039] Step S101: receiving the control instruction input by the user for one-key analysis of the PCIe eye diagram of the waveform to be analyzed;

[0040] Step S102: loading all the waveforms to be analyzed;

[0041] Step S103: selec...

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Abstract

The invention discloses a method and device of analyzing PCIe eye patterns. The method includes the steps that a control instruction for conducting one-key analysis on the PCIe eye patterns of waveforms to be analyzed and input by a user is received; all the waveforms to be analyzed are loaded; the current analysis waveforms are selected from the loaded waveforms to be analyzed, and the rate of the current analysis waveforms is judged; templates corresponding to PCIe waveform files of different rates are analyzed successively; the analyzed data information is automatically preserved; after the current analysis waveforms are analyzed, a next waveform is automatically selected from the loaded waveforms to be analyzed till all the waveforms to be analyzed are analyzed. By means of one-key analysis, the workload of an engineer is greatly reduced, the work efficiency of the engineer is improved, and the error brought by manual operation can be effectively avoided.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a method and device for analyzing a PCIe eye diagram. Background technique [0002] At present, PCIe conformance verification uses the oscilloscope to capture (.wfm|.bin) data waveforms, and then uses the SigTest eye diagram analysis tool provided by Intel for analysis. This tool is a tool specially designed for eye diagram analysis of PCIe and SATA waveform files. However, the SigTest eye diagram analysis tool has a complex interface and an extremely cumbersome operation process. It is necessary to manually load waveforms and template files repeatedly. Especially in the case of large data volumes, engineers need to spend a lot of time and energy on repeated operations. The waiting time is long, and the engineer needs to wait for the analysis to be completed and load the waveform file again, during which it is difficult to perform other work. However, PCIe eye diagram verif...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50G06T7/00
Inventor 廖祺许晓平钱身飞
Owner 上海浪潮云计算服务有限公司