Large soldering pin type aging method

Abstract

The invention discloses a large soldering pin type aging method, comprising the steps of: first respectively inserting anode and cathode pins of a capacitor into anode and cathode fixing bases on a clamp; placing the clamp on a mount; placing the mount in a baking oven to wait for aging; turning on an aging power supply switch; and a controller setting aging steps to start aging. The method can track and detect hidden troubles such as arc discharge caused by burr stabbing among positive and negative aluminum foils and electrolytic paper impurities in a capacitor, and employ a single capacitor constant current mechanism and an individual constant current source, wherein values are adjustable and a charging process linearly rises, thereby changing a traditional resistance current limiting mode; the method can intelligently detect and identify product positions and quantities, check product aging process work states at any moment, and check historic aging data at any moment so as to facilitate quality tracking; different steps can change current product magnitudes of voltage, current values and aging temperatures at will.

Description

Technical field: [0001] The invention belongs to the field of capacitor preparation, in particular to an aging method for a large solder pin type capacitor. Background technique: [0002] At present, the aging technology of welding pin capacitors adopts direct current or pulse pressure aging, that is to say, the oxide film formed inside the capacitor is repaired by the applied voltage and temperature, and the defects in the previous manufacturing process are eliminated. During the aging process of the applied voltage, the capacitor voltage Constantly rising and changing to reach the preset voltage value, but for individual defective capacitors, due to the gradual increase in voltage or internal heating at high temperature, it will cause explosion, short circuit, open circuit and other defects. After the aging is over, it must pass the post-process Only testing can determine the occurrence of these defects, and it is difficult to distinguish products with very small defects...

AI Technical Summary

Problems solved by technology

[0002]At present, the aging technology of welding pin capacitors adopts DC or pulse pressure aging, that is to say, the oxide film formed inside the capacitor is repaired and removed before the external voltage and temperature are applied. Defects in the manufacturing process, during the aging process of the applied voltage, the capacitor voltage continues to rise and change, reaching the preset voltage value, but for individual defective capacitors, due to the gradual increase in voltage or internal heating at high temperature, it will cause explosion, Defects such as short circuit and open circuit must pass the post-process test to determine the occurrence of these defects after the aging is over, and it is difficult to identify products with very small defects inside the product. The main disadvantages are as follows:

[0003] At the initial stage of applying voltage to the product, whether each capacitor is short-circuited or open-circuited cannot be ruled out, causing the short-circuited product to explode during the aging process, and the open-circuited product must be aged and flowed into the process test to find out

[0004] During the aging process, the applied voltage cannot be converted according to the predetermined requirements, resulting in poor consistency of product technical parameters after aging

[0005] Unfavorable states in the middle and late stages of aging cannot be identified and eliminated

[0006] During the aging process, the dynamic changes of voltage and current of each capacitor cannot be collected

[0007] Under high temperature and high pressure, the internal structure of the product changes abnormally, and the power protection cannot be cut off