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mass spectrometer

A mass spectrometer and mass analyzer technology, applied in the field of mass spectrometers, can solve the problems of sensitivity loss, difficulty in accurate analysis, etc.

Active Publication Date: 2018-07-10
THERMO FISHER SCI BREMEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The loss of sensitivity can make precise analysis of the results significantly more difficult, if not impossible

Method used

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Embodiment Construction

[0057] figure 1 A mass spectrometer 101 is shown comprising a number of elements including: an electrospray ion source 105; a lens arrangement 110; a quadrupole 115 with a beam blocker arrangement; an octupole 120; a high pressure chamber 125; a low pressure chamber 130; Curved ion trap (C-trap) 140; Higher energy collisional decomposition (HCD) chamber 145; Transfer multipole 150; Reagent ion source 155; Reagent inlet 160; Mass analyzer 165; Pressure controller 170; Gas type selector 175; controller 180; and gas supply 185, which includes supplies of various buffer gases, eg, helium (He), nitrogen (N2), and xenon (Xe). HCD chamber 145, C-trap 140, and mass analyzer 165, as well as other components of mass spectrometer 101, are connected to a vacuum system (not shown). In this example mass analyzer 165 is an Orbitrap TM ).

[0058] Gas type selector 175 is configured to allow controller 180 to select which gases in gas supply 185 should be supplied, and pressure controller ...

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Abstract

The present invention provides mass spectrometers for performing analysis of sample ions, and methods for operating the mass spectrometers. The mass spectrometer comprises: a first ion optic supplied with a first gas; a mass analyzer, wherein the performance of the mass analyzer is dependent on the pressure of the first gas in the first ion optic; and a controller for setting properties of the first gas based on characteristics of the analysis to be performed by the mass spectrometer, the properties including at least the pressure of the first gas.

Description

technical field [0001] The present invention relates to mass spectrometers and methods for operating mass spectrometers. Background technique [0002] Mass spectrometers typically include a number of different ion optics with different modes of operation for performing different functions. Examples of ion optics that a mass spectrometer may have include an element for collision-induced decomposition (collision cell), another element for intermediate ion storage (eg RF ion trap) and another element for mass analysis. [0003] Each of these different ion optics may be implemented using ion traps (eg, radio frequency ion traps and / or other ion trapping devices), but each ion trap will have different pressure requirements in order to perform their different functions. For example, mass analysis ion traps may require very low pressures because collisions between ions and residual gas molecules may cause scattering losses, which reduce signal strength and sensitivity. However, c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/00G01N27/62
CPCH01J49/0031H01J49/005H01J49/0077G01N27/623H01J49/0422H01J49/40H01J49/4245H01J49/4265
Inventor N·E·戴莫克E·丹尼索夫D·诺尔汀M·泽勒
Owner THERMO FISHER SCI BREMEN