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Chip vision detection system

A visual inspection and chip technology, applied in semiconductor/solid-state device testing/measurement, electrical components, semiconductor/solid-state device manufacturing, etc., can solve problems such as low detection efficiency

Inactive Publication Date: 2016-04-20
CHONGQING YUANCHUANG PHOTOELECTRIC TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a chip visual inspection system, which is suitable for solving the problem of low detection efficiency caused by manual inspection of chips in the prior art

Method used

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  • Chip vision detection system

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Embodiment Construction

[0020] The implementation of the present invention will be illustrated by specific specific examples below, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0021] It should be noted that the structures, proportions, sizes, etc. shown in the drawings attached to this specification are only used to match the content disclosed in the specification, for those who are familiar with this technology to understand and read, and are not used to limit the implementation of the present invention. Limiting conditions, so there is no technical substantive meaning, any modification of structure, change of proportional relationship or adjustment of size, without affecting the effect and purpose of the present invention, should still fall within the scope of the present invention. The disclosed technical content must be within the scope covered. At the same time, terms such as "upper"...

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Abstract

The invention provides a chip vision detection system. A chip frame provided with a chip moves on a guide rail and a camera arranged on the guide rail shoots the chip in the chip frame so that a chip image is obtained. The chip image is processed by use of an image detection system, and whether the chip is qualified is determined. By use of the chip vision detection system provided by the invention, machine automatic detection can be performed on the chip, the disadvantage of manually determining whether the chip is qualified or not in prior detection art is overcome, and compared to a manual detection mode, the efficiency is higher.

Description

technical field [0001] The invention relates to the technical field of chip detection by using images, in particular to a chip visual detection system. Background technique [0002] Chips are one of the key technologies restricting the development and popularization of computers in our country. The bottleneck of chip development is manufacturing equipment and production technology. One of the important factors for whether Loongson can be popularized on computers in my country is that my country's chip manufacturing industry must master the production process of chips. There are many technologies involved in the production process, among which the appearance inspection in the chip manufacturing process is one of the important contents. At present, the appearance inspection system in the chip manufacturing process is basically the standard and technology of INTEL and AMD in the United States. At present, there is no such chip appearance inspection system in our country. The...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/60
CPCH01L22/12
Inventor 李志远耿世慧李熙春
Owner CHONGQING YUANCHUANG PHOTOELECTRIC TECH CO LTD
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