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test socket

A test seat and a technology to be tested, which are applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., and can solve problems such as damage to the device to be tested 2, increasing pressing force, etc.

Active Publication Date: 2018-10-02
ISC CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it may be technically difficult to excessively increase the pressing force applied when the pressing member presses the device to be tested, and when the device to be tested 2 transmits excessive pressing force to the test socket 20, the device to be tested 2 may be damaged
[0011] Therefore, in the prior art, it is difficult to effectively perform an electrical test through a test socket on a device under test 2 having a plurality of terminals

Method used

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Embodiment Construction

[0040] Reference will now be made in detail to embodiments, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout. In this regard, the embodiments of the invention may have different forms and should not be construed as being limited to the descriptions set forth herein. Accordingly, the exemplary embodiments are merely described below, by referring to the figures, to explain aspects of the present description.

[0041] Hereinafter, exemplary embodiments will be described in detail with reference to the accompanying drawings.

[0042] Figure 4 is a perspective view of a test socket according to an exemplary embodiment, Figure 5 for Figure 4 A cross-sectional view of the test socket shown in, Image 6 illustrate Figure 5 operation of the test socket, such as Figure 4 , 5 , 6, according to an exemplary embodiment, the test socket 100 is disposed between the terminal 141 on the device under te...

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PUM

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Abstract

The invention provides a test socket. The test socket comprises a first thin sheet type connector, multiple conductive elastic units and a second thin sheet type connector. The conductive elastic units are arranged under the first thin sheet type connector. The second thin sheet type connector is arranged under the conductive elastic units. The upper part and the lower part of each of the conductive elastic units are supported by the first thin sheet type connector and the second thin sheet type connector. Empty space is formed near each of the conductive elastic units and is not liable to prevent the conductive elastic units from being pressed in the thickness direction. The conductive elastic units extend in the direction of surfaces. By use of the test socket, when numbers of terminals on a to-be-tested device are increased, electrical performance tests can be easily executed on the to-be-tested device.

Description

[0001] Cross References to Related Inventions [0002] This invention claims the rights and interests of the following patented inventions filed with the Korea Intellectual Property Office: Korean Patent Invention No. 10-2014-0141213 filed on October 17, 2014, and No. 10-2015- filed on June 12, 2015 Korean Patent No. 0083673, the disclosure of which is incorporated herein by reference in its entirety. technical field [0003] The present invention relates to one or more exemplary embodiments to a test socket, and more particularly to a test socket with maintainable electrical characteristics and a service life that can be effectively prevented even through frequent testing procedures. Reduced test sockets. Background technique [0004] Generally, it is necessary to stably form an electrical connection between the device under test and the test equipment in order to perform an electrical test on the device under test. The test socket serves as a device for connecting the de...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/073
CPCG01R1/07357
Inventor 郑永倍
Owner ISC CO LTD