Test method for color layer shedding rate of color film substrate
A technology of color film substrate and testing method, which is applied in the direction of instruments, nonlinear optics, optics, etc., can solve problems such as easy to cause misjudgment, difficult to test the shedding rate of the color layer on the color film substrate, and unable to quantify the degree of shedding, and achieve The effect of risk reduction
Active Publication Date: 2018-11-06
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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Problems solved by technology
Although this method is relatively intuitive, it cannot specifically quantify the degree of shedding, and the judgment level is too rough only through simple observation with a common magnifying glass, which may easily lead to misjudgment
Furthermore, the quality of the color filter is one of the important factors affecting the imaging quality of TFT-LCD. Therefore, the color filter has high requirements on the adhesion of the color layer on the glass substrate. It is difficult to test and define the color filter according to the above method. The quality of the adhesion on the glass substrate, that is, it is difficult to test the peeling rate of the color layer on the color filter substrate
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[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0046] Please also refer to Figure 1 to Figure 8 , an embodiment of the present invention provides a method for testing the color layer shedding rate of a color filter substrate, such as figure 1 As shown, the color filter substrate 1 includes a color layer 11 and a substrate 12, and the method includes:
[0047] Step1: Please refer to figure 2 and image 3 , cutting the colored layer 11 to form a grid pattern 20 , forming a color layer to-be-tested area 110 l...
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Abstract
The invention discloses a method for testing a color layer falling-off rate of a color film substrate. The method comprises steps as follows: a color layer is cut, a grid pattern is formed, and a color layer to-be-tested area located in a grid pattern area is formed; the color layer to-be-tested area is swept in the diagonal direction of the grid pattern; transmittance of the color layer to-be-tested area is measured, and first absorbance is obtained; an adhesive tape adheres to the color layer to-be-tested area; the adhesive tape is torn off; the transmittance of the color layer to-be-tested area is measured again, and second absorbance is obtained; the falling-off rate of the color layer to-be-tested area is calculated according to the first absorbance and the second absorbance. According to the method for testing the color layer falling-off rate of the color film substrate, the reliability of the color layer of the color film substrate can be accurately evaluated.
Description
technical field [0001] The invention relates to the technical field of color filter substrates, in particular to a method for testing the drop-off rate of a color layer of a color filter substrate. Background technique [0002] TFT-LCD (Thin film transistor-liquid crystal display: Thin film transistor-liquid crystal display) is currently the only one that has fully caught up with and surpassed CRT (Cathode Ray Tube, cathode) in terms of brightness, contrast, power consumption, life, volume and weight. Ray tube) display device, which has excellent performance, good mass production characteristics, high degree of automation, and broad development space, has quickly become the current mainstream product. Cell (liquid crystal box) liquid crystal panel is composed of array substrate (thin film transistor array substrate), CF substrate (color filter array substrate, also known as color filter substrate) and liquid crystal sandwiched between the two substrates. Array substrates an...
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IPC IPC(8): G02F1/13G02F1/1335
CPCG02F1/1309G02F1/133514
Inventor 巫景铭
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD