48results about How to "Reduce the risk of exceptions" patented technology

The embodiment of the invention discloses a display panel and a crack detection method thereof and a display device. The display panel is provided with a display area and a non-display area. The display panel includes a dummy pixel circuit and a light emitting device connected to the dummy pixel circuit; the crack detection line is located in the non-display area, one end of the crack detection line is connected with the test terminal, the other end of the crack detection line is connected with the driving signal line, the driving signal line is connected with the dummy pixel circuit, and signals transmitted to the driving signal line by the crack detection line can control the dummy pixel circuit to drive the light emitting device to emit light. According to the technical scheme providedby the embodiment of the invention,the crack detection lines, the corresponding driving signal lines and the dummy pixel circuit are connected through the test terminals, and the test signal is transmitted to the light-emitting device connected with the dummy pixel circuit, thereby achieving the crack detection of the display panel, facilitating the implementation of a narrow-frame design, reducing the abnormality risk of a detection image, and improving the failure analysis efficiency of the display panel and the detection efficiency of a defective product.

The invention discloses a service system pre-inspecting method. According to the method, problems which probably exist when rollback needs to be carried out after an upgraded version of a service system is released can be pre-inspected through uniform specification before the upgraded version is released, one-by-one testing and investigation are carried out on existing problems, and a warning message is sent out to remind a user to carry out corresponding modification. According to the method, risks that system anomalies occur after a new version is online in the prior art are reduced, or version rollback can be quickly completed if a fault occurs after the new version is online, and impacts caused by the fault are reduced.

The invention belongs to the technical field of lithium ion battery preparation, and particularly relates to a double-die head coating device. The double-die head coating device comprises a die head structure and a roller shaft structure matched with the die head structure, wherein the die head structure comprises a first die head and a second die head correspondingly arranged with the first die head; the first die head is provided with a first gasket; the second die head is provided with a second gasket; the first gasket and the second gasket are correspondingly arranged between the first diehead and the second die head; the first gasket is provided with a plurality of first shunting ports; the second gasket is provided with a plurality of second shunting ports; and the first shunting ports and the second shunting ports are arranged in a staggered corresponding mode. Compared with the prior art, the first gasket and the second gasket are correspondingly arranged between the first diehead and the second die head, so that the die head structure obtains a lug welding area with high coating utilization rate, and finally a pole piece with high coating utilization rate of the lug welding area is obtained, the risk of abnormality of a battery product is reduced, and the production efficiency and the production yield are improved.

The invention provides a preparation process for a polysilicon film. The preparation process comprises the following steps: introducing SiH4 into a vertical furnace, and performing constant-temperature constant-pressure deposition under the conditions of a pressure of 15-35 Pa and a temperature of 650-675 DEG C so as to allow the polysilicon film to grown on the surface of a silicon wafer. A polycrystalline silicon wafer prepared by using the polysilicon film preparation process of the invention has low warpage and small bending increment after polishing, and does not need treatment by an annealing process, so the risk of abnormality of the silicon wafer is effectively reduced, processing steps are decreased, a product processing cycle is shortened, and processing cost is lowered.

The invention discloses a special-shaped display panel and a display device. A display area of the special-shaped display panel is provided with special-shaped edges and includes a plurality of sub-pixels which are arranged in a first direction to form pixel rows and arranged in a second direction to form pixel columns, first sub-pixels, second sub-pixels and third sub-pixels which are located in the same pixel row form pixels of the special-shaped display panel, the pixels include special-shaped pixels and non-special-shaped pixels, the special-shaped pixels include first special-shaped pixels and second special-shaped pixels, and openings of the special-shaped pixels are greater than zero and smaller than those of the non-special-shaped pixels; a frame area points to the first direction of the display area, the non-special-shaped pixels and the second special-shaped pixels include first sub-pixels, second sub-pixels and third sub-pixels in sequence respectively, and the first special-shaped pixels included third sub-pixels, second sub-pixels and first sub-pixels in sequence. By the adoption of the special-shaped display panel and the display device, the color cast problem of the special-shaped edge areas is solved, and the display effect of the display panel is improved.

The invention discloses a method and a system for performing centralized monitoring on products of an automatic accessing type miniature data center. The method comprises the steps of authorizing accessing by a centralized monitoring management platform system by the product of the miniature data center; performing automatic detection identification on the miniature data center by the centralized monitoring management platform system, accessing the miniature data center which accords with a condition into the centralized monitoring management platform system; performing centralized monitoring on all accessed products of the miniature data center for automatically collecting, processing, storing and transmitting the uploaded data. The centralized monitoring management platform system supports automatic detection and identification to the products of the miniature data center, thereby realizing no requirement for manual operations, reducing an equipment abnormity risk caused by an improper operation of nonprofessional personnel, and furthermore improving convenience in use. The centralized monitoring management platform system performs automatic classification on the similar components of different miniature data centers and performs comparison monitoring on the data of components in the same kind, thereby analyzing the equipment data abnormity more easily and preventing faults in time.

The invention provides a suspicious transaction automatic identification and processing method, a terminal and a server. The suspicious transaction automatic identification and processing method comprises the following steps: obtaining yesterday transaction logs of all accounting processing systems, wherein the transaction log is a transaction request transmitted by a user and received by a transaction initiating channel terminal; forming a transaction number corresponding to the transaction request, and respectively transmitting the transaction request and the transaction number to a corresponding accounting processing system to enable the accounting processing system to perform accounting processing according to the transaction request, and forming a transaction log according to accounting processing information and the transaction number; and carrying out suspicious transaction automatic identification and processing according to the yesterday transaction log. According to the invention, the problems of suspicious transaction automatic analysis, transaction granularity identification and automatic processing of different types of transactions between heterogeneous systems can beeffectively solved.

The invention provides a data processing method based on a single chip microcomputer, a driver, a controller and a system. The data processing method based on a single chip microcomputer includes thesteps of setting a running permission condition and receiving a current regulating and controlling indication signal set sent by an external controller; determining whether the current regulating andcontrolling indication signal set satisfies the running permission condition or not, and if the current regulating and controlling indication signal set satisfies the running permission condition, according to the current regulating and controlling indication signal set, regulating and controlling operating parameters of a compressor, otherwise, ignoring the regulating and controlling indication signal set, and waiting for receiving a next regulating and controlling indication signal set. By means of the scheme, the abnormality of the compressor can be effectively reduced.

The invention relates to a rapid polishing method for a movable baffle. The method includes spraying the entire movable baffle by means of abrasive blasting; trimming scratches evenly on the surface of the movable baffle; performing a primary trim on the surface of the movable baffle by abrasive paper, performing a secondary trim on the surface of the movable baffle by grinding cloth, and repeating the primary trim and the secondary trim until scratches on the surface of the movable baffle disappear; and performing mirror-surface treatment on the surface of the movable baffle until the surface becomes as bright as a new mirror surface. The rapid polishing method is simple to operate and the polishing process is simple. The movable baffle processed by the method can meet the using requirements and reduce failure probability of production equipment. The rapid polishing method can prolong service life of the movable baffle, and reduce time and money cost spent in discarding used products and purchasing new products.

The invention discloses an order state processing method and device, a storage medium and a server. The method comprises the steps: receiving an order settlement request initiated by a client, and determining a background order state of order data associated with the order settlement request; establishing a connection between the client and a payment channel party according to the order settlement request, so that the client executes a payment operation instruction; trying to receive an order callback message of the payment channel party, the order callback message comprising a payment end order state set by the payment channel party for the order data, and being generated after the payment channel party completes payment operation; if the order callback message is not successfully received, acquiring a payment end order state of the order data from the payment channel party; and updating the background order state to the payment end order state. According to the technical scheme provided by the invention, the data consistency can be ensured, and the safety of order data can be improved.

The invention provides a device for detecting the levelness and perpendicularity of an objective table and a using method thereof. A first plane plate is horizontally placed; the second surface plate is fixed at one end of the first surface plate and is perpendicular to the first surface plate; the first plane plate and the second plane plate form a right-angle device with a 90-degree angle; a gradienter for detecting levelness is arranged on the upper surface of the first plane plate; pressure-sensitive distance detection sensors are arranged at the upper left position, the upper right position, the lower left position and the lower right position of the second plane plate respectively; and when the convex part of the pressure-sensitive distance detection sensor is extruded, the extruded pressure-sensitive distance detection sensor displays a retraction distance value. The device provided by the invention can quickly and accurately measure whether the semiconductor equipment is in a normal state or not, and can more accurately test and debug the levelness and verticality of the bearing table, thereby reducing the abnormal risk when the wafer bearing box is opened and closed, and guaranteeing the safety of a wafer.