A panel detection method and detection system thereof

Abstract

The invention discloses a panel detection method and system. The method comprises the steps that high-temperature reliability testing is carried out on a sample set to be tested to determine panels having defects in the tested sample set; the tested sample set is the standard panel set comprising multiple uncut panels; the test sample set is disassembled to obtain a mother board containing multiple array substrates, and the leak current value, corresponding to the grid cut-off voltage value of the TFT of the array substrates, of the array substrates in the panel having defects is determined according to the grid cut-off voltage value of the TFT of the array substrates; if the difference between the determined leak current value and the predetermined standard off-stage current value is smaller than or equal to a set threshold value, it is judged that the TFT of the array substrates is qualified; if not, it is judged that the TFT is unqualified. By means of the method, before the standard panels are made into a module, whether the TFT of the array substrates in the standard panel set is qualified or not can be judged in time, the technological procedure time is saved, and the cost is reduced.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a panel detection method and a detection system thereof. Background technique [0002] Currently, Liquid Crystal Display (LCD) panels have the advantages of high image quality, small size, and light weight, and are widely used in products such as mobile phones, notebook computers, televisions, and monitors. [0003] The TFT switch in the thin film transistor (Thin Film Transistor, TFT) array substrate plays an extremely important role in the liquid crystal display, and the performance of the TFT switch directly affects the quality of the liquid crystal display. However, traditional LCD display products using liquid crystal technology will have a large number of high-temperature stains or crosstalk between adjacent pixels during reliability tests. This poor batch quality will cause low competitiveness in the market. The existing high-temperature reliability test method is genera...

AI Technical Summary

Problems solved by technology

However, the traditional LCD display products using liquid crystal technology will have a large number of high-temperature stains or crosstalk between adjacent pixels during the reliability test. This poor batch quality will cause low competitiveness in the market.

The existing high-temperature reliability test method is generally to make the product into a module and then put it into a temperature control box (high-temperature storage device) for more than several hours. If a high-temperature defect occurs, a large amount of module materials will be wasted

But at this time, the substrate design of the product has already been completed in the previous stage, and the product has also gone through the process from the substrate to the module. The cycle is very long, and there is not enough time for design and process changes after the problem is exposed.

Images