Instantaneous frequency measuring method and system

Abstract

The invention provides an instantaneous frequency measuring method and system. The method includes that a polarization modulator performs polarization modulation on to-be-detected microwave signals and a first adjustable light source as well as a second adjustable light source; a polarization beam splitter divides the to-be-detected microwave signals to first branch optical signals and second branch optical signals; a first polarization controller and a first analyzer perform phase modulation on the first branch optical signals; a second polarization controller and a second analyzer performs intensity modulation on the second branch optical signals. A dispersion element is utilized for performing dispersion attenuation on the two branch optical signals. A first photoelectric detector converts the first branch optical signals subjected to dispersion attenuation to first branch electric signals. A second photoelectric detector converts the second branch optical signals subjected to dispersion attenuation to second branch electric signals. A digital processing unit obtains the instantaneous frequency of the to-be-detected microwave signals according to the input signals of the photoelectric detectors. The method and system provided by the invention can meet requirements for measurement range and measurement precision in instantaneous frequency measurement.

Description

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AI Technical Summary

Benefits of technology

This patented technology provides a way to measure frequencies accurately without requiring any filters or complicated equipment that affects how much light travels during transmission. It uses both types of lights with identically-polarized beams splitting them up into multiple paths before being sent separately over separate devices like sensors. By measuring these waves twice they get their amplitudes proportional to each other's difference between those on opposite sides. These measurements help determine if the transmitted electromagnetic wave has been properly modified based upon its characteristics such as time delay (time) varying due to factors like temperature).

Problems solved by technology

This patents describes various technical techniques related to improving the performance of high speed electronically controlled nanometer wave technology (HCNW). These include reducing noise interference during measurements, increasing sensitivity at low temperatures, enhancing immunity against electromagnetism while also ensuring accurate results when analyzing small microscopic waves or very weakly absorbing materials such as plasma membranes.

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