A device for teaching model of transmission electron microscope
A teaching model and transmission electron microscope technology, applied in teaching models, educational appliances, instruments, etc., can solve the problems of students' incomprehension and abstract content, and achieve the effect of deepening understanding and accelerating the learning process.
Inactive Publication Date: 2018-07-10
BEIJING INSTITUTE OF TECHNOLOGYGY
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[0003] In view of this, the present invention provides a device for teaching model of transmission electron microscope, which can imitate the imaging principle of transmission electron microscope, and solve the problem of abstract content and difficulty for students to understand in the teaching process of transmission electron microscope principle
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[0024] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0025] Transmission electron microscope (abbreviated as transmission electron microscope, TEM) is a large-scale scientific instrument capable of observing and analyzing the microstructure of matter with ultra-high resolution at the atomic level. It basically works like figure 1 shown. A high-energy electron beam is used to irradiate the thin sample 4 after beam expansion and collimation. If the microstructure of the sample 4 has a certain spatial order (such as a crystal sample), the electron beam will be strongly diffracted and divided into several different beams. The electron beam in the same direction as the original incident electron beam is called the transmitted beam, and the electron beam in other directions is called the diffracted beam. Information about the structure of the sample 4 is carried in each electron beam. The information in the tra...
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The invention discloses a transmission electron microscope teaching model device which comprises a base, a collimation light source, a specially-made grating piece, a first diaphragm, a first lens, a second diaphragm, a magnifying lens group and an optical screen. The first lens is a convex lens; plate glass on which parallel slit stripes in the different directions are graved in the different areas is adopted as the specially-made grating piece; the collimation light source, the first diaphragm, the specially-made grating piece, the first lens, the second diaphragm, the magnifying lens group and the optical screen are sequentially and coaxially fixed to the base from top to bottom; the magnifying lens group comprises more than one convex lens or more than one concave lens; the first lens is located under the specially-made grating piece and is d<0> away from the specially-made grating piece, wherein d<0> is not larger than the lens diameter of the first lens; the second diaphragm is located under the first lens and is f<1> away from the first lens, wherein f<1> is the focal distance of the first lens. According to the device, the complex transmission electron microscope working principle can be intuitively shown, and the effects of accelerating the learning process and deepening understanding on the transmission electron microscope principle are achieved.
Description
technical field [0001] The invention belongs to the technical field of transmission electron microscopy, and in particular relates to a teaching model device for transmission electron microscopy. Background technique [0002] In order to solve the problem that the teaching of this kind of courses at this stage is mainly based on books and is too abstract, it is difficult for students to understand the relatively complicated working principle of transmission electron microscopy. The existing method is to visit the actual transmission electron microscope after learning the principles described in the book. However, not every school is equipped with transmission electron microscopes. At the same time, transmission electron microscopes are very expensive, and the number cannot really meet the teaching needs, let alone allow students to operate them. And there is currently no relevant teaching device that can imitate the transmission electron microscope, so the existing methods c...
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IPC IPC(8): G09B23/22
CPCG09B23/22
Inventor 苏铁健华牧天龙玉涵
Owner BEIJING INSTITUTE OF TECHNOLOGYGY