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A test system for arc transient temperature field based on spectroscopic imaging

A technology of transient temperature field and testing system, which is applied in the direction of physical/chemical change thermometers, thermometers, heat measurement, etc., can solve the problems of low accuracy of temperature field, unsuitable temperature field, etc., and achieve the effect of high practical value

Active Publication Date: 2018-12-14
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the existing arc temperature field test method is not suitable for testing the temperature field of the switching device breaking arc or the temperature field obtained is low in accuracy, thus proposing a method based on the spectroscopic imaging method for arc transient Temperature Field Test System

Method used

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  • A test system for arc transient temperature field based on spectroscopic imaging
  • A test system for arc transient temperature field based on spectroscopic imaging
  • A test system for arc transient temperature field based on spectroscopic imaging

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specific Embodiment approach 1

[0028] Specific implementation mode one: refer to figure 1 and figure 2 Describe this embodiment mode, a kind of arc transient temperature field test system based on the spectroscopic imaging method described in this embodiment mode, the test system includes an objective lens 1, a double-sided reflective prism 2, a first plane reflector 3, a second plane reflector Mirror 4, first narrowband filter 5, second narrowband filter 6 and photosensitive element 7;

[0029] The objective lens 1 is used to amplify the arc light;

[0030] Both sides of the double-sided reflective prism 2 are reflective surfaces, and its bottom surface is opposite and parallel to the exit mirror of the objective lens 1, and its main section is an isosceles triangle;

[0031] Part of the arc light emitted by the objective lens 1 is incident on a part of the photosensitive surface of the photosensitive element 7 after being reflected by a reflective surface of the double-sided reflective prism 2, reflect...

specific Embodiment approach 2

[0036] Embodiment 2: In the arc transient temperature field testing system based on spectroscopic imaging described in this embodiment, the photosensitive element 7 is a 48-bit CCD.

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Abstract

An arc transient temperature field testing system based on a spectral imaging method belongs to the field of arc temperature field testing. The arc transient temperature field testing system settles a problem of unsuitability of an existing arc temperature field testing method for testing the temperature field of switching electric appliance break arc or low accuracy of the obtained temperature field. An object lens is used for amplifying arc light. Two side surfaces of a double-surface reflecting prism are reflecting surfaces. Partial arc light which is emergent from the object lens is reflected by one reflecting surface of the double-surface reflecting prism, then is reflected by a first planar reflecting mirror and penetrates through a first narrow bandpass optical filter, the arc light is emergent to partial light sensing surface of a light sensing element; and the other partial arc light which is emergent from the object lens is reflected by the other reflecting surface of the double-surface reflecting prism, then is reflected by a second planar reflecting mirror and penetrates through a second narrow bandpass optical filter, and then the arc light is emergent to the other partial light sensing surface of the light sensing element. The light paths of two arc light beams which are incident to the light sensing element are same. The light sensing element is connected with a computer. The arc transient temperature field testing system is suitable for testing the arc transient temperature field.

Description

technical field [0001] The invention relates to an arc transient temperature field testing system, in particular to an arc transient temperature field testing system based on a spectroscopic imaging method. Background technique [0002] When a switching device is used to break the current, an arc will inevitably be generated between the contacts of the device. For a millisecond-level electrical device to break the arc, the temperature at the root of the arc and the temperature distribution in the space between the contacts directly affect the ablation characteristics of the contacts. , electrical life and the important parameters that determine the final ability to break the arc. The ablation damage characteristics and ablation amount of the switching device breaking arc on the contacts have attracted much attention in the field of arc and electrical contact. In order to study the ablation characteristics of the arc on the contact surface, the temperature field of the breaki...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K11/00
CPCG01K11/00
Inventor 周学张勇崔行磊翟国富陈柏翰
Owner HARBIN INST OF TECH
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