A method and device for analyzing yarn thickness unevenness
An analysis method and analysis device technology, applied in measuring devices, analysis materials, instruments, etc., can solve problems such as inability to effectively monitor and analyze yarn thickness unevenness
Active Publication Date: 2019-03-29
江苏圣蓝科技有限公司
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Problems solved by technology
The distribution over the decades Figure 1 It cannot effectively monitor and analyze the unevenness of yarn thickness, and cannot guide yarn production and weaving
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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Embodiment
[0070] Such as figure 2 As shown, according to "Application of Capacitive Evenness Tester in Yarn Quality Control", the voltage value of 0V is -100%, the voltage value of 6V is +100%, and 0% is 3V. The formula can be get:
[0071] It can be obtained that i=(α+1)*3, namely The formula can be converted to f((α+1)×3), which can be obtained through the integral formula
[0072] Through integral calculation, it can be concluded that the offset rate includes two parts:
[0073] 1) Distribution range: 34.38% to 41.25%, corresponding to an area of 22;
[0074] 2) Distribution range: -20.00%~-3.75%, the corresponding area is 364;
[0075] from figure 2 It can be seen from the calculation results that the deviation rate is mainly concentrated between -20.00% and -3.75%. Therefore, it can be predicted that the details of this part have a greater impact on production.
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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The invention provides a method and a device for analyzing uneven thickness of yarns. The method comprises the following steps: acquiring a practical yarn density distribution diagram of yarns; comparing it with a theoretical yarn density distribution diagram of the yarns, thereby acquiring a yarn density deviation ratio; and monitoring and analyzing the uneven thickness condition of the yarns according to the yarn density deviation ratio. The method is a quantitative analysis method for the uneven thickness of the yarns. According to the method, the treating speed is high; the uneven thickness condition of the yarns can be intuitively judged according to the acquired yarn density deviation ratio and image comparison result and the production guidance and the cloth cover forecasting can be accordingly performed; and especially, the method can be utilized to accurately and quantitatively analyze the uneven thickness condition of the yarns.
Description
【Technical field】 [0001] The invention belongs to the field of yarn testing, and relates to an analysis method and device for uneven yarn thickness. 【Background technique】 [0002] In the spinning process, uneven yarn thickness can be caused by uneven raw materials, changes in the spinning environment, failure of yarn equipment, and improper spinning process. The uneven thickness of the yarn, especially within a certain range, has a great impact on the cloth surface. The evenness tester can test the yarn linear density distribution map (ie, the yarn thickness distribution map), but there is no scientific analysis method. The distribution over the decades Figure 1 It cannot effectively monitor and analyze the unevenness of yarn thickness, and cannot guide yarn production and weaving. 【Content of invention】 [0003] In order to solve the problems existing in the prior art, the present invention proposes an analysis method and device for uneven yarn thickness, and the meth...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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IPC IPC(8): G01N33/36
CPCG01N33/365
Inventor 韦德怀杨俊海冯亚民张卫平冯宝华
Owner 江苏圣蓝科技有限公司