Passive direction-finding test method based on two-dimensional orthogonal interferometer for whole star conditions
A test method and interferometer technology, applied in the testing of machines/structural components, instruments, measuring devices, etc., can solve problems such as near-field effect errors, large-scale entire satellites, and conditions that do not meet the conditions of darkroom testing, and achieve a reasonable plan , Functional evaluation of the effective effect
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[0029] The preferred embodiments of the present invention are given below in conjunction with the accompanying drawings to describe the technical solution of the present invention in detail.
[0030] Such as figure 1 , figure 2 As shown, the present invention is used for the passive direction finding test method based on two-dimensional orthogonal interferometer under the whole star condition, comprises the following steps:
[0031] Step 1: After the satellite is powered on, the electronic reconnaissance load is powered on in sequence, and its working mode is set to full-band scanning mode to obtain the background signal of each frequency band;
[0032] The method of the present invention pre-sets a default working mode in the electronic reconnaissance load system, and when the power-on is completed, the default working mode will be executed if there is no other instruction. In order to set the working mode of full-band scanning, it is necessary to pre-indicate instructions...
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