Semiconductor component overturning device and test equipment thereof
A test equipment, semiconductor technology, applied in semiconductor/solid-state device manufacturing, electrical components, conveyor objects, etc., can solve the problem that semiconductor components cannot be picked and placed at the same time
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[0023] see figure 1 and figure 2 , is a perspective view of the semiconductor element inversion testing equipment and a perspective view of the semiconductor element inversion device according to the first embodiment of the present invention. Such as figure 1 As shown, first viewed from the whole, the semiconductor device inversion testing equipment of the present invention includes a semiconductor device inversion device 1 and a sorting machine 6 . In this embodiment, the sorting machine 6 includes a turret 62 arranged on a working table 61 and a feeding area 64, a testing area 65 and a discharging area 66 arranged around the turret 62, wherein The material area 64 can be a vibrating plate (Bowl feeder) 641 , and the output area 66 includes a packaging roll 63 . The turret 62 includes a plurality of suction heads 621 arranged at intervals at an angle, one end of which sucks a semiconductor element 4 from the feed area 64 and rotates to the test area 65, and then turns t...
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