Laminboard sample middle layer observation device
An observation device and an intermediate layer technology, which is applied in the field of observation devices for the intermediate layer of sandwich panel samples, can solve the problems of inconvenient sampling, inconvenient manipulation of the sandwich panel firmly clamped, and inconvenient observation of the intermediate layer of the sandwich panel, etc. The effect of convenient sampling and observation
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[0012] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0013] Such as figure 1 As shown, a device for observing the middle layer of a sandwich panel sample includes a base 11, one side of the bottom of the base 11 is provided with a first support shaft 12, the other side of the bottom of the base 11 is provided with a second support shaft 13, and the second support The shaft 13 is arranged parallel to the first support shaft 12; the base 11 is provided with a partition 14; one side of the base 11 is provided with ...
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