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Object feature information detection system and detection method

A technology of feature information and detection methods, applied in the field of detection systems, can solve problems such as inaccurate measurement, high cost of measuring instruments, and measurement errors, and achieve the effect of improving efficiency

Active Publication Date: 2019-08-13
SHENXUN COMP KUNSHAN +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, there is a certain measurement error in the accuracy of this method of measuring height, which means that if the reference scale or the measurement scale is not accurate enough, it is easy to measure inaccurately. On the contrary, if the reference scale or the measurement scale are fine enough The cost of this measuring instrument is also too high when
Furthermore, the measuring instrument can only measure the height, if additional measurement information is required, a corresponding measuring device is required

Method used

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  • Object feature information detection system and detection method
  • Object feature information detection system and detection method
  • Object feature information detection system and detection method

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Embodiment Construction

[0022] figure 1 It is a schematic diagram of the structure of an embodiment of the detection system of the present invention. figure 2 It is a schematic diagram of the use of an embodiment of the detection system of the present invention. see figure 1 and figure 2 , the detection system is used to measure the detection object 40 , and the detection system includes: a transmitting antenna 10 , a receiving antenna 20 and a processing module 30 . The transmitting antenna 10 is set opposite to the receiving antenna 20 , and the detection body 40 is located between the transmitting antenna 10 and the receiving antenna 20 , and the processing module 30 is connected to the transmitting antenna 10 and the receiving antenna 20 .

[0023] image 3 It is a flowchart of an embodiment of the detection system of the present invention. see Figure 1 to Figure 3 , in one embodiment, the transmitting antenna 10 sends an output beam toward the detection object 40 (step S01), so that aft...

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Abstract

The invention discloses an object feature information detection system, which is used for measuring a test body. The detection system comprises a transmitting antenna, a receiving antenna and a processing module. The transmitting antenna transmits an output wave beam to the test body and receives a corresponding reflected beam of the test body; the receiving antenna receives the output wave beam; the processing module is connected with the transmitting antenna and the receiving antenna; and the processing module determines channel capacity according to the output wave beam received by the receiving antenna, calculates feedback coefficients through statistical calculation according to the reflected beam in a time domain, generates material information of test body corresponding to the channel capacity, describes appearance contour according to the feedback coefficients and judges appearance contour feature information according to a judgment program. Therefore, the material information and feature information of the test body can be obtained conveniently and accurately, and detection efficiency is improved.

Description

[0001] 【Technical field】 [0002] The invention provides a detection system, in particular to a detection system for object feature information. [0003] 【Background technique】 [0004] There are many ways to measure the height of an object. For example, through a floor-standing measuring instrument, you only need to place the object on the instrument, and calculate the measurement scale from the reference scale at the bottom of the object to the top of the object. The height of the object can be calculated based on the distance relationship between the measured scale and the reference scale. [0005] However, there is a certain measurement error in the accuracy of this method of measuring height, which means that if the reference scale or the measurement scale is not accurate enough, it is easy to measure inaccurately. On the contrary, if the reference scale or the measurement scale are fine enough , the cost of this measuring instrument is also too high. Furthermore, the me...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B15/04
CPCG01B15/04
Inventor 吴书逸黄嘉民
Owner SHENXUN COMP KUNSHAN