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Test method and device for response time

A technology of response time and test method, applied in fault hardware test method, error detection/correction, detection of faulty computer hardware, etc., can solve the problems of difficult repeatable test, high labor cost, impact on test accuracy, etc.

Active Publication Date: 2017-07-14
BANMA ZHIXING NETWORK HONGKONG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This test method, on the one hand, has high labor costs and is difficult to use in a large number of repetitive tests; on the other hand, the test accuracy is also affected by human factors.

Method used

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  • Test method and device for response time

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Embodiment Construction

[0091] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0092] Terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. As used in the embodiments of the present invention and the appended claims, the singular forms "a", "said" and "the" are also intended to include the plural forms unless the context clearly indicates otherwise.

[0093] It should be understood that the term "and / or" used herein is only an association relationship describing associated objects, which means that there may be three relationships, for example, A and / or B, which may mean that A exists alone, and A and B exist simultaneously. B, there are three situations of B alone. In addition, the character " / " in this articl...

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PUM

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Abstract

The invention provides a test method and device for response time. The method comprises the steps that continuously-captured screen images of user equipment are acquired, wherein the continuously-captured screen images at least include the screen images from a function trigger moment to a response completion moment; the last frame of the acquired screen images is used as a result frame, and a first frame image obtained after response completion is determined according to image similarity and time difference between all frame images and the result frame image; and the response time of the user equipment to a function is determined by use of the difference value between a moment corresponding to the determined image and the function trigger moment. Through the test method and device, test labor cost can be saved, and the influence of human factors on test accuracy is lowered.

Description

【Technical field】 [0001] The invention relates to computer application technology, in particular to a response time testing method and device. 【Background technique】 [0002] Response time is an important parameter that reflects the performance of user equipment, and the speed of response time is closely related to user experience. At present, the test of user device response time is almost completely dependent on manual work. Testers need to use a camera to capture the screen changes after the trigger operation, then export the video captured by the camera, and rely on manual work to find the time point when the user device completes the response frame by frame. This test method, on the one hand, has high labor costs and is difficult to use in a large number of repetitive tests, and on the other hand, the test accuracy is also affected by human factors. 【Content of invention】 [0003] In view of this, the present invention provides a response time testing method and devi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06T7/00
CPCG06F11/2268G06F11/2273G06T7/0004G06T2207/10016G06T2207/10024G06T2207/20021G06T2207/30108
Inventor 杨清夙潘子晶
Owner BANMA ZHIXING NETWORK HONGKONG CO LTD
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