Contour measurement method applied to three-dimensional contour measurement
A technology of profile measurement and three-dimensional profile, which can be used in measurement devices, optical devices, instruments, etc., and can solve problems such as low accuracy
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[0042] figure 1 is a schematic flow chart of a contour measurement method for three-dimensional contour measurement according to an embodiment of the present invention. Such as figure 1 As shown, a profile measurement method for three-dimensional profile measurement may generally include the following steps:
[0043] S1, placing the object to be measured on the measurement platform, performing laser scanning on the scanning points on the surface of the object to be measured in sequence, the laser light is reflected to the projection screen, and the corresponding projection point of each projection point on the projection screen is recorded Two-dimensional coordinate information.
[0044]S2, select the coordinate system of the motion platform, and transform the two-dimensional coordinate information of the projection point into the three-dimensional coordinates of the scan point in the coordinate system of the motion platform according to the relationship between the projecti...
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