Unlock instant, AI-driven research and patent intelligence for your innovation.

Contour measurement method applied to three-dimensional contour measurement

A technology of profile measurement and three-dimensional profile, which can be used in measurement devices, optical devices, instruments, etc., and can solve problems such as low accuracy

Inactive Publication Date: 2017-07-18
苏州凡目视觉科技有限公司
View PDF6 Cites 25 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

One is the passive method, which does not require a specific light source and relies entirely on the natural light conditions of the object for scanning. Binocular technology is often used, but the accuracy is low, and only objects with geometric features can be scanned, which cannot meet the requirements of many fields.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Contour measurement method applied to three-dimensional contour measurement
  • Contour measurement method applied to three-dimensional contour measurement
  • Contour measurement method applied to three-dimensional contour measurement

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] figure 1 is a schematic flow chart of a contour measurement method for three-dimensional contour measurement according to an embodiment of the present invention. Such as figure 1 As shown, a profile measurement method for three-dimensional profile measurement may generally include the following steps:

[0043] S1, placing the object to be measured on the measurement platform, performing laser scanning on the scanning points on the surface of the object to be measured in sequence, the laser light is reflected to the projection screen, and the corresponding projection point of each projection point on the projection screen is recorded Two-dimensional coordinate information.

[0044]S2, select the coordinate system of the motion platform, and transform the two-dimensional coordinate information of the projection point into the three-dimensional coordinates of the scan point in the coordinate system of the motion platform according to the relationship between the projecti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a contour measurement method applied to the three-dimensional contour measurement, which relates to the three-dimensional contour detection technology field. The contour measurement method comprises the following steps: recording the two-dimensional coordinate information of each projection point corresponding to the projection screen through the laser reflection manner; selecting a motion platform coordinate system; according to the relationship between the projection point calibrated by the standard to-be-measured object and the corresponding scanning point, transforming the two-dimensional coordinate information of the projection point into the three-dimensional coordinate information of the scanning point in the motion platform coordinate system; obtaining the three-dimensional contour information of the to-be-measured object by fitting the data of the three-dimensional coordinate information of each scanning point; and displaying the three-dimensional contour and the surface state image of the to-be-measured object based on the three-dimensional contour information of the to-be-measured object. According to the invention, the main defects that a transparent object is normally hard to measure in the laser ray scanning technology. With the method, a transparent object can also be scanned effectively for stable scanning data so as to measure the three-dimensional contour data of the to-be-measured object.

Description

technical field [0001] The invention relates to the technical field of three-dimensional contour detection, in particular to a contour measurement method for three-dimensional contour measurement. Background technique [0002] With the development of information and communication technology, the method of acquiring images is not limited to using various video cameras, cameras, etc., which can only obtain the plane image of the object, that is, the image scanning means of the two-dimensional information of the object. In many fields, it is necessary to obtain three-dimensional information of objects. 3D scanning is used to create geometric surfaces of objects and is an extremely effective tool for digitizing 3D information. The scanned points of the 3D scan can be used to interpolate the surface shape of the object, and the denser the points, the more accurate the model can be created. Three-dimensional scanners can be simulated as cameras, and their line of sight is conica...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/24
CPCG01B11/2433
Inventor 姚峥嵘龚儒波刘志鹏翁海峰
Owner 苏州凡目视觉科技有限公司