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Algorithm self-test circuit and method

A self-inspection circuit and algorithm technology, applied in the field of data processing, can solve the problem of adding additional system resources, and achieve the effect of improving development efficiency and reducing time and resource overhead

Active Publication Date: 2019-08-02
SHANDONG INSPUR SCI RES INST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When multiple algorithms need to be self-inspected, they need to be identified and self-inspected separately, increasing additional resources of the system

Method used

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  • Algorithm self-test circuit and method

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Embodiment Construction

[0023] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments. It should be noted that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] The algorithm self-inspection circuit includes a random parameter generation module, a parameter storage module, a self-inspection data storage module, a self-inspection process control module and an interface module, the interface module is connected with an external microcontroller, the parameter storage module and the self-inspection module The data storage module is all connected to the interface module and the algorithm unit; the random parameter generation module, the parameter storage module, the self-inspection data storage module and the interface module are all ...

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Abstract

The invention particularly relates to an algorithm self-checking circuit and method. The algorithm self-checking circuit comprises a random parameter generation module, a parameter storage module, a self-checking data storage module, a self-checking process control module and an interface module, wherein the interface module is connected with an external microcontroller, and the parameter storage module and the self-checking data storage module are both connected to the interface module and algorithm units; the random parameter generation module, the parameter storage module, the self-checking data storage module and the interface module are all connected to the self-checking process control module, and the random parameter generation module is further connected with the parameter storage module.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to an algorithm self-test circuit and method. Background technique [0002] Algorithm represents a systematic method to describe the strategy mechanism for solving problems. It is a series of clear instructions for solving problems. It can obtain the required output within a limited time for a certain standard input. With the continuous improvement of performance requirements, the complexity and diversity of algorithms are also on the rise. Therefore, before the algorithm is adapted, a self-test is required to detect the correctness, integrity, security, matching, etc. of the algorithm under the current conditions. [0003] Since various algorithms have different forms and require different parameters, they need to be re-deployed after porting to a new environment, and the algorithm self-test may also need to be redesigned due to changes in conditions. This adds resistance...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG06F11/2273
Inventor 王子彤姜凯
Owner SHANDONG INSPUR SCI RES INST CO LTD