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A photolithography process for gpp chip manufacturing

A technology of photolithography and photoresist, which is applied in the field of photolithography and can solve problems such as explosion hazards

Active Publication Date: 2021-08-03
SUNTIFIC MATERIALS WEIFANG LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

And when the oven is baked, the solvent that volatilizes to a high temperature and sealed condition has a certain risk of explosion

Method used

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  • A photolithography process for gpp chip manufacturing

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] A photolithography process for GPP chip manufacture, the steps are as follows:

[0028] 1. Coating: Spin coating on both sides of a clean and dry silicon wafer substrate using SUN-WS001, a common negative photoresist product from Startech.

[0029] 2. Pre-baking: After coating, bake on a hot plate at 110°C for 2 minutes to remove the solvent in the film, and the measured film thickness is about 3 μm.

[0030] 3. Exposure: UV exposure, through the mask plate to expose both sides of the silicon wafer at the same time.

[0031] 4. Medium baking: Baking in an oven at 120°C for 4 minutes to improve the adhesion between the film and the silicon substrate.

[0032] 5. Developing: developing with 2.38wt% tetramethylammonium hydroxide (TMAH) aqueous solution as the developing solution, the developing temperature is 25°C, and the developing time is 3min, to form photolithographic patterns.

[0033] 6. Fixing: Rinse the developed silicon wafer with deionized water to remove the ...

Embodiment 2

[0038] A photolithography process for GPP chip manufacture, the steps are as follows:

[0039] 1. Coating: Spin coating on both sides of a clean and dry silicon wafer substrate using SUN-WS002, a common negative photoresist product from Startech.

[0040] 2. Pre-baking: After coating, bake in an oven at 110°C for 8 minutes to remove the solvent in the film, and the measured film thickness is about 5 μm.

[0041] 3. Exposure: UV exposure, through the mask plate to expose both sides of the silicon wafer at the same time.

[0042] 4. Developing: developing with 1wt% KOH aqueous solution as the developing solution, the developing temperature is 25°C, and the developing time is 3min to form photolithography pattern.

[0043] 5. Fixing: Rinse the developed silicon wafer with deionized water to remove the developer and impurities remaining on the surface of the film.

[0044] 6. Post-baking: Bake the fixed silicon wafer in an oven at 200°C for 30 minutes to remove residual solvent,...

Embodiment 3

[0048] A photolithography process for GPP chip manufacture, the steps are as follows:

[0049] 1. Coating: Spin-coat on a clean and dry silicon wafer substrate with SUN-WS003, a common negative photoresist series product from Startech.

[0050] 2. Pre-baking: After coating, bake on a hot plate at 110°C for 3 minutes to remove the solvent in the film, and the measured film thickness is about 10 μm.

[0051] 3. Exposure: UV exposure, through the mask plate to expose both sides of the silicon wafer at the same time.

[0052] 4. Medium baking: bake in an oven at 120°C for 3 minutes.

[0053] 5. Development: develop with 2.38wt% TMAH aqueous solution as the developer, the development temperature is 25°C, and the development time is 4min to form a photolithographic pattern.

[0054] 6. Fixing: Rinse the developed silicon wafer with deionized water to remove the developer and impurities remaining on the surface of the film.

[0055] 7. Post-baking: Bake the fixed silicon wafer in ...

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Abstract

The invention discloses a photolithography process for manufacturing GPP chips, which includes the following steps: (1) glue coating: coating a negative photoresist without xylene solvent on the surface of a clean and dry silicon chip substrate; (2) before Baking to remove the solvent in the film; (3) Exposure; (4) Development: use alkaline aqueous solution for constant temperature development; (5) Fixing: use deionized water to rinse the substrate; (6) Post-baking: remove The remaining solvent makes the film solidified and dense; (7) Corrosion: corrode the base material with acid mixture; (8) Remove glue. The photolithography process is repeated to create complex patterns. The process of the present invention avoids the use of cyclized rubber-based negative photoresist containing toxic and harmful xylene, and replaces the harmful volatile organic developer and fixer with alkaline aqueous solution and deionized water, so that the photolithography process becomes easier. Safety, health and environmental protection.

Description

technical field [0001] The invention belongs to the field of chip manufacturing, and in particular relates to a photolithography process for GPP (glassivation passivationparts) chip manufacturing. It can also be applied to the process of using photoresist to protect the substrate from the corrosion of hydrofluoric acid, nitric acid, hydrochloric acid and other mixtures in any photolithography process. Background technique [0002] Photolithography technology is the core of the microelectronics manufacturing process, including the selection of photoresist types and the setting of photolithography process conditions, both of which are indispensable, and together determine the effect of product photolithography. [0003] Usually in the GPP chip manufacturing process, a photoresist that is resistant to corrosion by a mixture of hydrofluoric acid and nitric acid is required to etch the grid lines on the silicon wafer. When etching the grid lines, the back of the silicon wafer al...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/027G03F7/26
CPCG03F7/26H01L21/0274
Inventor 孙逊运孟祥龙刘运王安栋于凯
Owner SUNTIFIC MATERIALS WEIFANG LTD