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Spectral analysis device and spectral analysis method

A kind of spectral analysis, one-sided technology, applied in spectrometry/spectrophotometry/monochromator, material analysis through optical means, material analysis, etc., can solve problems such as inaccurate pressure correction

Active Publication Date: 2021-04-20
HORIBA LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0014] However, in a structure in which a pump is arranged downstream of the measurement cell, the sample gas in the measurement cell will be in a decompressed state, so accurate pressure correction cannot be performed using the conventional linear relationship without intercept.

Method used

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  • Spectral analysis device and spectral analysis method
  • Spectral analysis device and spectral analysis method
  • Spectral analysis device and spectral analysis method

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Experimental program
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Embodiment Construction

[0035] One embodiment of the infrared spectroscopic analysis device of the present invention will be described below with reference to the drawings.

[0036] The infrared spectrum analysis device 100 of the present embodiment is an exhaust gas analysis device that measures the concentration of a plurality of components contained in exhaust gas as a sample gas discharged from an internal combustion engine such as an automobile as time-series data.

[0037] Specific as figure 1 As shown, the infrared spectrum analysis device 100, for example, samples part or all of the exhaust gas discharged from the exhaust pipe of the automobile by the sample sampling part 2, and the exhaust gas sampled by the sample sampling part 2 is not diluted. into the measurement unit 3, using the FTIR method to detect carbon monoxide (CO), carbon dioxide (CO 2 ), nitric oxide (NO), nitrogen dioxide (NO 2 ), nitrogen oxides (NOx), water (H 2 O) and other multiple components to measure each concentrat...

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Abstract

The present invention provides a spectroscopic analyzer and a spectroscopic analysis method capable of obtaining the concentration of a predetermined component with high accuracy when measuring the concentration of a predetermined component contained in a sample gas in a state of reduced pressure compared with atmospheric pressure, and measuring the concentration of the predetermined component in the sample gas. In a spectroscopic analyzer for the concentration of the predetermined component contained, the absorbance of the predetermined component contained in the sample gas is measured in a state of reduced pressure compared to atmospheric pressure, and a calibration that represents the relationship between the absorbance of the predetermined component and the concentration of the predetermined component is used. curve and the relational expression between the pressure of the sample gas and the concentration of the predetermined component at the time of measurement, the concentration of the predetermined component is calculated, and in the graph in which one axis is the pressure axis and the other axis is the concentration axis, the above The relationship has intersections with the pressure axis other than zero.

Description

technical field [0001] The present invention relates to spectroscopic analysis devices using infrared spectroscopy such as Fourier transform infrared spectroscopy. Background technique [0002] Conventionally, as a device for measuring the concentration of a predetermined component contained in a sample gas such as exhaust gas, for example, there is a device using the FTIR (Fourier Transform Infrared Spectroscopy) method (Patent Document 1 (Japanese Patent Laid-Open Publication No. Hei 9-101257 )). [0003] In the analyzer employing the FTIR method, a pump is provided upstream of the measurement cell, and the pressure of the sample gas in the measurement cell becomes atmospheric pressure or a pressure in the vicinity thereof. That is, the pressure at the time of measurement of the sample gas is atmospheric pressure or a pressure in its vicinity. [0004] Here, the concentration of the specified component is calculated by using a calibration curve obtained from the relation...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/31
CPCG01N21/31G01J3/0297G01N21/274G01J3/26G01J3/42G01N21/3504G01N33/004G01N2021/3595Y02A50/20G01N33/0037G01N2201/127G06T11/206
Inventor 西村克美
Owner HORIBA LTD