A device for studying products after ion photoexcitation

Abstract

The invention relates to the field of photoelectrons and molecular reaction kinetics, and provides a device used for studying an ion photoexcitation product. A focusing electrode group is located inside an ion beam entrance. A mass selection electrode group I is located inside a particle exit I. A mass selection electrode group II is located inside a particle exit II. The angle between the axes of the mass selection electrode group I and the mass selection electrode group II is 30 degrees. The input and output faces of a photomultiplier tube array are respectively connected with the positive and negative electrodes of a pulse voltage source. Electrons can pass through the photomultiplier tube array to generate a signal at a corresponding position of an electron detector. An electrostatic deflector is located between the focusing electrode group and the mass selection electrode group I. When the electrostatic deflector is grounded, particles moving along the axes of the focusing electrode group and the mass selection electrode group I can pass through the electrostatic deflector. After certain voltage is applied to the electrostatic deflector, the charged particles can produce deflection of a certain angle, and a capacitive load is accessed between the input face of the photomultiplier tube array and a ground wire.

Description

technical field [0001] The invention relates to the field of photoelectron imaging technology and the field of molecular reaction dynamics, in particular to a device for studying products after ion light excitation, which can simultaneously measure charged fragments and neutral fragments. Background technique [0002] An ion beam storage device is usually required in the particle velocity imaging device used to study optical excitation. The electrostatic ion beam storage device usually consists of two sets of electrodes. One of its advantages is that the ions have good directionality and high energy. Or ion fragments produced by electron-induced reactions or decays. However, for linear electrostatic ion beam storage devices, the above-mentioned advantages are limited in some experiments to detect ion fragments, wherein neutral fragments can leave the ion storage area through the electrode set on one side of the ion beam storage device, and in the storage For charged fragmen...

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Problems solved by technology

In addition, in some ion systems, according to the non-adiabatic coupling, the electron energy obtained by light excitation is distributed according to its vibration degree of freedom; when the vibration energy is converted into electron energy again, the electron is emitted from the system. This process is relatively The process of photoexcitation has a delay on the order of microseconds. However, the defect of the existing technology is that in most existing photoelectron spectroscopy experiments, only the experimental data related to the instant electron emission can be obtained, but the delay cannot be detected. Emit electrons and obtain their related information, the device for studying the products after ion photoexcitation can solve the problem

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