Device used for studying ion photoexcitation product
An after-product, light-excited technology, applied in ion source/gun, parts of particle separator tube, particle separation tube, etc., can solve the problem of inability to detect delayed emission electrons, etc. good effect
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[0023] Such as figure 1It is a schematic diagram of the structure of the present invention, mainly including an ion source (1), an accelerator (2), a time-of-flight mass spectrometer (3), a particle mass selector (4), a low-temperature cold shield (5), an ion beam entrance (6), and a focusing The focusing electrode group (7 ), electrostatic deflector (8), composed of electrode I (9-1), electrode II (9-2), electrode III (9-3), electrode IV (9-4), electrode V (9-5) The mass selection electrode group I (9), composed of electrode VI (10-1), electrode VII (10-2), electrode VIII (10-3), electrode IX (10-4), electrode X (10-5) Composed of mass selective electrode group II (10), laser entrance (11), particle exit I (12), ion detector I (13), magnetic shield (14), electronic background reduction plate (15), reflection plate ( 16), ion correction plate (17), extraction electrode (18), beamforming electrode (19), photomultiplier tube array (20), electron detector (21), particle outlet ...
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