Method for studying product after ion photoexcitation

Abstract

The invention relates to the field of optoelectronic technologies and molecular dynamics, in particular to a method for studying a product after ion photoexcitation. The method comprises the steps that: an ion beam fragment enters a low temperature cold screen; a mass selection electrode group II is applied with a single-slope voltage which is progressively increased according to the same slope; a pulse electric field is applied on the ion beam fragment after the ion beam fragment passes through a focusing electrode group, so that voltages on the focusing electrodes are sequentially and progressively increased; ions interact with the laser to produce ion fragments and photoelectrons; the ion fragments fly toward the focusing electrode group and are reflected, a voltage is applied on a focusing electrode I, the ion fragments fly toward an ion detector II after being deflected by means of an electrostatic deflection, neutral fragments in the ion fragments fly toward an ion detector I, and the photoelectrons arrives at an input surface of a photomultiplier array; a voltage pulse is applied between the input surface and an output surface; time resolution of the device for a kind of ions is tested; a time interval between a laser pulse and a high voltage pulses is set, and an instant emission electrons and delayed emission electrons are detected; and charged ion fragments and photoelectron information are compared.

Description

technical field [0001] The invention relates to the field of photoelectron imaging technology and the field of molecular reaction dynamics, in particular to a method for studying products after ion light excitation, which can simultaneously measure charged fragments and neutral fragments. Background technique [0002] An ion beam storage device is usually required in the particle velocity imaging device used to study optical excitation. The electrostatic ion beam storage device usually consists of two sets of electrodes. One of its advantages is that the ions have good directionality and high energy. Or ion fragments produced by electron-induced reactions or decays. However, for linear electrostatic ion beam storage devices, the above-mentioned advantages are limited in some experiments to detect ion fragments, wherein neutral fragments can leave the ion storage area through the electrode set on one side of the ion beam storage device, and in the storage For charged fragmen...

AI Technical Summary

Problems solved by technology

In addition, in some ion systems, according to the non-adiabatic coupling, the electron energy obtained by light excitation is distributed according to its vibration degree of freedom; when the vibration energy is converted into electron energy again, the electron is emitted from the system. This process is relatively The process of photoexcitation has a delay on the order of microseconds. However, the defect of the existing technology is that in most existing photoelectron spectroscopy experiments, only the experimental data related to the instant electron emission can be obtained, but the delay cannot be detected. When electrons are emitted and related information is obtained, the method for studying the products after ion photoexcitation can solve the problem

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