Photovoltaic cell edge breakage and blunt and V-shaped notch detection algorithm

A technology of photovoltaic cells and detection algorithms, applied in computing, image data processing, instruments, etc., can solve the problems of poor detection repeatability, cumbersome production process and high cost, achieve non-contact surface quality detection, overcome manual detection, and have huge applications. effect of value

Active Publication Date: 2018-01-09
HEBEI UNIV OF TECH +1
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Problems solved by technology

As an important power generation carrier, photovoltaic cells have the advantages of high light energy conversion efficiency, long service life, relatively mature production technology, and low cost. As a result, photovoltaic cells are prone to various defects, and the existence of defects will reduce their conversion efficiency and service life. Therefore, the detection of photovoltaic cell defects is an indispensable part of the production process.
[0003] At present, the field mainly relies on manual visual inspection, the detection efficiency and quality are relatively low, and the detection repeatability is poor, and the cost is high. Therefore, the traditional manual detection can no longer meet the needs of the field.

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  • Photovoltaic cell edge breakage and blunt and V-shaped notch detection algorithm

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Embodiment Construction

[0030] The technical solution in the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the present invention. Obviously, the described embodiments are only some embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] Refer to attached figure 1 As shown, the present invention requests protection of a detection algorithm for chipping of photovoltaic cells and blunt and V-shaped notches, the algorithm includes the following steps,

[0032] Step 1: Image Preprocessing

[0033] 1-1. Calibrate the camera;

[0034] 1-2. RGB three-channel image acquisition;

[0035] 1-3, image correction, on the basis of step 1-2, carry out correction operation to the collected RGB three-channel image;

[0036] 1-4, ima...

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Abstract

The invention provides a photovoltaic cell edge breakage and blunt and V-shaped notch detection algorithm, which is characterized by carrying out image correction and image conversion pretreatment oneach collected frame image to obtain a target image of a photovoltaic cell; carrying out gray top hat transform to obtain an image of the photovoltaic cell only comprising a grid line portion; carrying out threshold segmentation, and filling the grid line portion, so that influence of the internal portion of grid lines on defect detection can be eliminated; obtaining a foreground image only comprising the grid line portion, and carrying out threshold segmentation to obtain a background image; carrying out morphological close operation processing and filling the edge breakage and blunt and V-shaped notch portion; and comparing difference between the background image obtained after morphological processing and the unprocessed background image, so that detection of the edge breakage and bluntand V-shaped notch can be realized. The algorithm overcomes the defect of manual detection, can effectively improve accuracy of defect detection of the photovoltaic cell and has a huge application value for the photovoltaic industry.

Description

technical field [0001] The invention relates to the technical field of photovoltaic cell surface defect detection, in particular to a detection algorithm for photovoltaic cell chipping and blunt and V-shaped notches. Background technique [0002] In recent years, people have become more and more dependent on clean energy, and the output of photovoltaic cells has further expanded. As an important power generation carrier, photovoltaic cells have the advantages of high light energy conversion efficiency, long service life, relatively mature production technology, and low cost. As a result, photovoltaic cells are prone to various defects, and the existence of defects will reduce their conversion efficiency and service life. Therefore, the detection of photovoltaic cell defects is an indispensable part of the production process. [0003] At present, the field mainly relies on manual visual inspection, the detection efficiency and quality are relatively low, and the detection re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06T7/136G06T7/155G06T7/194G06T7/80
Inventor 陈海永赵慧芳李帅庞悦王丙宽王玉李扬贾皓元
Owner HEBEI UNIV OF TECH
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