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2 results about "Top-hat transform" patented technology

In mathematical morphology and digital image processing, top-hat transform is an operation that extracts small elements and details from given images. There exist two types of top-hat transform: the white top-hat transform is defined as the difference between the input image and its opening by some structuring element, while the black top-hat transform is defined dually as the difference between the closing and the input image. Top-hat transforms are used for various image processing tasks, such as feature extraction, background equalization, image enhancement, and others.

An infrared small target detection method based on adaptive multi-scale filtering

PendingCN122336425AThresholdingSmall target
This invention discloses an infrared small target detection method based on adaptive multi-scale filtering, belonging to the field of infrared target detection technology. The steps include: image preprocessing, multi-scale top-hat transformation, adaptive threshold binarization, multi-dimensional screening of candidate targets, and IoU-based cross-frame matching and target validity determination. This invention employs a three-scale elliptical structuring element to enhance target robustness, achieves adaptive binarization based on global statistics, and suppresses false alarms through noise-sensing parameter switching and temporal verification. The entire process has low computational complexity and high real-time performance, enabling stable and accurate infrared small target detection under complex backgrounds, strong noise, and low signal-to-noise ratio conditions. It is suitable for scenarios such as military reconnaissance, security monitoring, infrared guidance, and low-altitude target detection.
Owner:CHINA OPTICS (HANGZHOU) INTELLIGENT OPTOELECTRONICS TECH CO LTD

Wavelet transform and adaptive dual-mode based laser spot positioning method

The application discloses a laser spot positioning method based on wavelet transform and adaptive double mode. First, wavelet decomposition and inverse transform reconstruction are performed on an infrared image to generate a denoising image and a background noise image, and then a background suppression image is obtained, and the background suppression image is processed to obtain a to-be-measured image; second, multi-scale white top hat transform and adaptive threshold segmentation are performed on the to-be-measured image, candidate spot connected domains are extracted, geometric features thereof are obtained, and the geometric features are used for preliminary screening; then, energy distribution features of the candidate spot connected domains are extracted, comprehensive evaluation is performed in combination with the geometric features, and a coarse positioning coordinate is determined; finally, the number of saturated pixels in a core region is counted and compared with a dynamic proportional threshold value, a state-adaptive double-mode fine positioning mechanism is enabled, and a final fine positioning coordinate is obtained. The application effectively suppresses complex background noise and local highlight interference, reduces errors caused by flat-top saturation distortion, and realizes stable and high-precision positioning under poor illumination.
Owner:NANJING UNIV OF SCI & TECH