A detection method for grid line offset on the surface of photovoltaic cells

Abstract

The invention provides a detection algorithm for grid line offset on the surface of a cell. The detection algorithm includes the steps of performing preprocessing of image correction and image conversion on each frame of acquired image to obtain a target image of a photovoltaic cell; carrying out threshold segmentation of the target image, filling a grid line part, then carrying out shape conversion to eliminate the influence of defects at welding spots of the cell on the outline extraction, and accurately extracting the outline 1 of the edge of the cell; processing the target image by using grayscale top-hat transform to obtain a cell image only containing the grid line part; enhancing the image to eliminate the influence of a discontinuous grid line caused by the welding spots; carryingout threshold segmentation, and filling a gate line part to extract the outline 2 of the outermost peripheral gate line of the cell; and calculating the minimum distance between the outline 1 of the edge and the outline 2 of the outermost peripheral gate line of the cell, setting a threshold and comparing the minimum distance with the threshold to realize the detection of the grid line offset on the surface of the photovoltaic cell.

Description

technical field [0001] The invention relates to the technical field of detection of defects on the surface of photovoltaic cells, in particular to a detection algorithm for grid line offset on the surface of photovoltaic cells. Background technique [0002] In recent years, the world is facing energy shortages and increasingly serious environmental pollution problems, and people's demand for solar energy, a clean energy source, is increasing. Silicon solar cells are commonly used in photovoltaic power generation technology. Because of their high light energy conversion efficiency, relatively mature production technology, and low cost, large-scale use of photovoltaic power generation technology has become more common, and the existence of surface defects in photovoltaic cells will reduce its performance. Conversion efficiency and service life, so the detection of surface defects of photovoltaic cells is crucial to the control of production quality. [0003] The current produ...

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Problems solved by technology

[0003] The current production line mainly relies on artificial visual inspection, which has the disadvantages of low detection efficiency, long hours of labor and fatigue, low detection quality, poor detection repeatability, and high cost. Traditional manual detection can no longer meet the needs of the site.

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