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xrd sample stage

A sample platform and sample technology, applied in the field of XRD detection, can solve the problems of large interference of characteristic peaks and large error of detection results, etc.

Active Publication Date: 2019-07-09
INST OF CHEM CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In the test analysis of conventional XRD, because the sample to be tested is placed on the sample stage of the open platform, so in the whole test process, the sample to be tested is basically all exposed in the air, so that interference peaks are prone to appear, for the sample to be tested The characteristic peaks of the sample to be tested, especially the sample that is more sensitive to air, have great interference, which makes the error of the test result larger

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Embodiment Construction

[0023] In the present invention, in the case of no contrary description, the used orientation words such as "up, down, left, right" usually refer to the orientation shown in the accompanying drawings and the orientation in practical applications, "inner, outer "Refers to the inside and outside of the outline of the part.

[0024] The invention provides an XRD sample stage, combined with figure 1 and figure 2 As shown in , the XRD sample stage includes a support platform 10 for carrying the sample 17 to be tested and a sealing cover 11 that is sealed to the support platform 10 and covers the outside of the sample 17 to be tested, wherein the sealing cover 11 is provided with The first opening and the second opening, the first opening is sealingly covered with the first transparent film 12 for irradiating the X-rays to be measured 17, and the second opening is sealingly covered with the first transparent film 12 for the The characteristic X-rays generated after the X-rays irr...

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Abstract

The invention relates to the field of XRD detection and discloses an XRD sample stage. The XRD sample stage comprises a supporting base (10) for carrying a to-be-detected sample (17) and a seal cover(11), wherein the seal cover (11) is in tight fitting with the supporting base (10) and covers the to-be-detected sample (17). The seal cover (11) is provided with a first opening and a second opening, a first transparent film (12) allowing X rays for irradiating the to-be-detected sample (17) to enter covers the first opening hermetically, and a second transparent film (13) allowing characteristic X rays generated after the X rays irradiate the to-be-detected sample (17) to emit out covers the second opening hermetically. The XRD sample stage is capable of shortening exposure time of the to-be-detected sample for XRD detection to air, so that detection result accuracy is improved.

Description

technical field [0001] The invention relates to the field of XRD detection, in particular to an XRD sample stage. Background technique [0002] X-ray diffraction (XRD for short) is X-ray diffraction. By performing X-ray diffraction on materials and analyzing their diffraction patterns, it is a research method to obtain information such as the composition of materials, the structure or morphology of atoms or molecules inside materials. X-ray is an electromagnetic wave with a very short wavelength (about 20-0.06 angstroms), which can penetrate a certain thickness of material, and can make fluorescent substances emit light, photographic emulsion, and gas ionization. The X-rays generated by bombarding the metal "target" with electron beams contain X-rays with specific wavelengths corresponding to various elements in the target, which are called characteristic (or identification) X-rays. [0003] XRD is one of the most powerful and fastest analytical methods for solid materials....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20008
Inventor 孙杨袁震
Owner INST OF CHEM CHINESE ACAD OF SCI