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High frequency time domain reflectometry probing system

一种探针、被测装置的技术，应用在探查系统领域，能够解决TDR模块损坏、ESD损坏等问题

Active Publication Date: 2018-03-06
TEKTRONIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to this high sensitivity, TDR modules are also particularly susceptible to damage from electrostatic discharge (ESD)
In fact, a common field failure of TDR modules is ESD damage caused when the user connects the TDR probe to the DUT

Method used

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  • High frequency time domain reflectometry probing system
  • High frequency time domain reflectometry probing system
  • High frequency time domain reflectometry probing system

Examples

Experimental program
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Embodiment Construction

[0012] Generally, in order to protect the input of a TDR measurement instrument from being damaged by ESD, one known technique is to employ a switch capable of directing the signal path of the probe into one of two electrical paths: one path to ground and one path through Input to TDR instrument. Such switch-based probing systems are designed such that they direct the probe's signal path to ground when the user touches the DUT with the probe. In this way, when the probes touch the DUT, any electrostatic charge that may build up on the DUT will be safely discharged to ground rather than through the highly sensitive inputs of the TDR instrument. After any such charge has been safely discharged, the switch then redirects the probe signal path to the input of the TDR instrument in order to perform the TDR measurement. Traditional TDR probes use various active switching circuits to guide the probe's signal path.

[0013] Some traditional TDR accessory modules, such as the model 8...

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PUM

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Abstract

A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves withinthe housing to cause a first connector and a second connector of the self-aligning connector set to be connected through an adapter of the self-aligning connector set, thereby establishing a signal path through the probe. The first connector, second connector, and adapter are structured so that their respective ground conductors become connected prior to their respective signal conductors becoming connected. Electro-static charge present at the test point is safely discharged through a resistor to ground before the signal path through the probe is established, thereby preventing damage to theprobe and connected host instrument. When the probe tip is removed from the device-under-test, the spring forces a disconnection of the first and second connectors.

Description

technical field [0001] The present disclosure relates to test and measurement instruments, and more particularly, to probing systems for time domain reflectometry applications. Background technique [0002] Time domain reflectometry (TDR) is a widely used measurement technique for determining the characteristics of electrical wires, such as broadband internet cables. Typically, TDR analysis involves propagating a stimulus signal (usually a step or pulse signal) into the line being measured and then measuring the signal reflected from any electrical discontinuities in the line. The amplitude of the reflected signal can be used to determine the impedance of the discontinuity, and the time it takes for the reflected signal to return can be used to determine the physical location of the discontinuity in the line. [0003] TDR measurements can be performed using general purpose test and measurement instruments such as the DSA8300 Series Sampling Oscilloscope manufactured by Tekt...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067
CPCG01R1/06722G01R1/06738G01R1/0416G01R1/36H01R13/7031H01R13/71G01R1/06772G01R31/11
Inventor J.B.雷蒂
Owner TEKTRONIX INC
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