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Method and system for automatic recognition of spatial dimension in spectral calibration of imaging spectrometer

An imaging spectrometer and spectral calibration technology, which is applied in the field of automatic identification method and system of spatial dimension in spectral calibration of imaging spectrometer, can solve problems such as differences in calibration results, and achieve the effect of accurate calibration and good repeatability

Active Publication Date: 2019-11-15
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

The manual selection of spatial dimensions is easily affected by the subjective consciousness of the operator, resulting in the same data, and each operation has a large difference in the calibration results due to the selection of spatial dimensions (that is, the x coordinate value)

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  • Method and system for automatic recognition of spatial dimension in spectral calibration of imaging spectrometer
  • Method and system for automatic recognition of spatial dimension in spectral calibration of imaging spectrometer
  • Method and system for automatic recognition of spatial dimension in spectral calibration of imaging spectrometer

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Embodiment Construction

[0042] In order to make the purpose, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0043] first reference figure 1 , is a flow chart of the method for automatic identification of spatial dimensions in the spectral calibration of the imaging spectrometer according to the present invention. In an embodiment of the method for automatic identification of spatial dimensions in the spectral calibration of the imaging spectrometer of the present invention, the following steps are included:

[0044] First, calculate the maximum gray value corresponding to each frame image in the [0,Width) space dimension, the cumulative value of the maximum value of the gray value, and...

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Abstract

The invention discloses a method for automatically identifying spatial dimensions in the spectral calibration of imaging spectrometers, comprising the following steps: calculating the maximum gray value corresponding to each frame image in the [0, Width) spatial dimension and the maximum value of the gray value an accumulated value and a maximum value of the accumulated value; comparing the accumulated value of the maximum value of the gray value with the maximum value of the accumulated value to obtain the number of effective spatial dimensions, and calculating the comprehensive weight of each effective spatial dimension, to get the best spatial dimension. The method for automatic identification of space dimension in spectrum calibration of imaging spectrometer of the present invention has the beneficial effects of being able to realize automatic identification of space dimension, accurate calibration and good repeatability.

Description

technical field [0001] The invention relates to the technical field of spectral calibration, in particular to a method and system for automatic identification of spatial dimensions in spectral calibration of imaging spectrometers. Background technique [0002] Imaging spectrometer is a new type of optical remote sensor that integrates spectrum and image. The spectral calibration of imaging spectrometer is to determine the central wavelength and spectral bandwidth of each spectral channel of imaging spectrometer. The spectral calibration of imaging spectrometer is the basis of radiation calibration. Accurate spectral calibration is a necessary condition for obtaining correct spectral information of ground objects. [0003] The spectral calibration method of the imaging spectrometer is the wavelength scanning method. This method is to record different wavelengths and the DN value of the corresponding wavelength at a certain pixel, and then use Gaussian fitting to the wavelengt...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28
CPCG01J3/2823
Inventor 王明佳孙慈杨晋冯树龙李天骄宋楠姚雪峰崔继承
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI