Temperature sensor on basis of interference spectrum vernier effects and loop cavity ring-down spectrum technologies
A temperature sensor and ring-down spectroscopy technology, which is applied in the field of temperature sensors based on the vernier effect of interference spectrum and ring cavity ring-down spectroscopy technology, can solve the problem of low sensitivity of optical fiber sensors, and achieve the effects of improving temperature measurement sensitivity and reducing instrument cost.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0056] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0057] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0058] like figure 1 As shown, specifically, the present invention relates to a temperature sensor based on the interferometric vernier effect and ring cavity ring-down spectroscopy technology, which sequentially includes: DFB fiber laser, polarizer, electro-optic modulator, isolator, FP cavity, Ring-do...
PUM
Property | Measurement | Unit |
---|---|---|
length | aaaaa | aaaaa |
length | aaaaa | aaaaa |
length | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com