Patch test terminal and processing method thereof
A technology for testing terminals and processing methods, which is applied to measuring devices, measuring electrical variables, and measuring device casings. The effect of artificial strength
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[0044] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0045] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0046] Please refer to Figure 1 to Figure 5 , figure 1 Axonometric view of the patch test terminal provided by the embodiment of the present invention; figure 2 for figure 1 main view of image 3 for figure 1...
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