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A Method of Radiation Source Fingerprint Feature Extraction Based on Variance Dimension

An extraction method and fingerprint feature technology, applied in the field of radiation source fingerprint feature extraction, can solve the problems of difficulty in meeting the requirements for the effectiveness and reliability of individual radiation source identification, and low accuracy of individual radiation source identification.

Active Publication Date: 2021-07-06
HARBIN INST OF TECH
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  • Abstract
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  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the traditional characteristic parameters are difficult to meet the requirements of the validity and reliability of individual radiation source identification, resulting in a low accuracy rate of individual radiation source identification, and propose a radiation source fingerprint feature extraction method based on the variance dimension

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  • A Method of Radiation Source Fingerprint Feature Extraction Based on Variance Dimension
  • A Method of Radiation Source Fingerprint Feature Extraction Based on Variance Dimension
  • A Method of Radiation Source Fingerprint Feature Extraction Based on Variance Dimension

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specific Embodiment approach 1

[0026] Specific implementation mode one: combine figure 1 , figure 2 , image 3 To illustrate this embodiment, the specific process of a radiation source fingerprint feature extraction method based on variance dimension in this embodiment is as follows:

[0027] Step 1. Segment processing the received one-dimensional radiation source signal to obtain the one-dimensional radiation source signal segment S 1 ,S 2 ,…S i ..., S n , to display the subtle features of the signal and increase the feature dimension; S i is the i-th one-dimensional radiation source signal segment, 1≤i≤n, and n is a positive integer;

[0028] The process is:

[0029] In order to describe the radiation source signal from a more subtle point of view, and to better distinguish the differences between different radiation source signals, the radiation source signal is first divided into several signal segments. The specific implementation method of signal segmentation is to use the sliding window func...

specific Embodiment approach 2

[0042] Specific embodiment 2: The difference between this embodiment and specific embodiment 1 is that in the step 2, the variance dimension feature extraction is performed on the one-dimensional radiation source signal segment obtained in step 1, and the variance dimension feature vector is obtained; the specific process is as follows: :

[0043] The variance dimension is a fractal dimension based on the Hurst exponent, which can be used to analyze the fractal properties of time series. Variance dimension D σ The relationship with the Hurst exponent H is shown in the following formula:

[0044] D. σ =E+1-H

[0045] Where E represents the Euclid dimension, for one-dimensional time series, take E=1;

[0046] The classic calculation method of Hurst index is the rescaled range method. The R / S analysis method was originally proposed by the British hydrologist H.E. Hurst when he was studying the storage capacity of the Nile reservoir. The R / S analysis method is simple to calc...

specific Embodiment approach 3

[0072] Specific embodiment 3: The difference between this embodiment and specific embodiment 1 or 2 is: when i=1 in the step 21, set S i Divide into β equal-length subintervals with an initial length of A; β is a positive integer; the process is:

[0073] For a one-dimensional radiation source signal segment S with intercepted signal segment length w i , the one-dimensional radiation source signal segment S i Divide into β equal-length subintervals with initial length A, and use the sequence {d t} represents the sequence within each subinterval.

[0074] Other steps and parameters are the same as those in Embodiment 1 or Embodiment 2.

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Abstract

A radiation source fingerprint feature extraction method based on variance dimension, the invention relates to a radiation source fingerprint feature extraction method. The purpose of the present invention is to solve the problem that the traditional characteristic parameters are difficult to meet the requirements for the validity and reliability of individual radiation source identification, resulting in a low accuracy rate of individual radiation source identification. The specific process of a radiation source fingerprint feature extraction method based on the variance dimension is as follows: 1. Process the received one-dimensional radiation source signal into segments to obtain one-dimensional radiation source signal segments; The source signal segment is subjected to variance dimension feature extraction to obtain the variance dimension feature vector. The invention is used in the field of individual identification of radiation sources.

Description

technical field [0001] The invention relates to a method for extracting radiation source fingerprint features. Background technique [0002] Radiation source individual identification, also known as "radiation source fingerprint identification" or "specific radiation source identification", mainly uses passively received radiation source signals, analyzes its subtle characteristic parameters, and uses fingerprint feature extraction to distinguish different individuals of the same type of radiation source . Due to the difference in the physical components of the radiation source, each radiation source waveform has unique characteristics, which are called fingerprint features, and the key technology of individual radiation source identification lies in the selection and extraction of fingerprint features. Individual identification of radiation sources has many applications in both military and civilian applications. The military aspect is mainly for individual identification...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/00G06K9/62G06N3/04
CPCG06N3/044G06F2218/18G06F2218/08G06F18/2113G06F18/2411
Inventor 赵雅琴吴龙文王昭张宇鹏李锦江
Owner HARBIN INST OF TECH