Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

FPGA-based TDC realization method

An implementation method and technology of delay chain, which can be used in image data processing, program control, instruments, etc., and can solve problems such as DNL influence and regional delay change.

Inactive Publication Date: 2018-08-10
BEIJING INSTITUTE OF TECHNOLOGYGY
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The technical effect that this invention addresses is how it can improve the accuracy of distance measurement between two objects accurately without causing any problems with longer delays due to factors like temperature or humidity changes over time. This technology could be used also during manufacturing processes where precise measurements are needed quickly and at an affordable cost.

Problems solved by technology

This patents describes how to measure distance accurately from a specific point or range through multiple points simultaneously. Current techniques involve either measuring directly or indirectly via specialized circuits within an ASIC chip. These techniques require expensive equipment and consume considerable amounts of space during operation due to their complexity. Additionally, current solutions only work well over limited ranges where they could provide high precision measurements.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • FPGA-based TDC realization method
  • FPGA-based TDC realization method

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0019] Use the clock management tool (DCM) of FPGA to generate two 400MHz clocks with a difference of 180°, CLK and CLK180, which are distributed in two clock regions. On these two clock regions, deploy the same delay chain program. An inverter group is added to the signal input end, and the delay time of the input signal reaching the two modules is adjusted so that the difference does not exceed 1 ns. By adopting the method of the present invention, the number of delay chains in each clock domain can be doubled, that is, each delay chain requires 20 delay units. There are 49-50 delay units in each BANK column of the FPGA, and there is sufficient layout and wiring space to realize the above design.

[0020] The delay chain uses the CARRY4 carry unit of the FPGA, and the CIN of each carry unit is connected to the COUT of the next unit to form a delay chain. The COUT of each delay unit is output to the flip-flop as a tap, and the clock of the local clock domain is used for dat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Te invention provides an FPGA-based time-digital conversion (TDC) realization method. By using a digital clock management (DCM) tool of an FPGA, a clock is subjected to phase shift to generate 2 or 4clocks with phase differences of 180 degrees or 90 degrees; the generated clocks are distributed in different clock regions of the FPGA; and a same delay chain program is configured. Through a phase inverter group, the difference of time of reaching each group of delay chains by an input to-be-tested signal does not exceed 1ns. The method has the practical effects that the clock is subjected to frequency doubling, so that the length of the delay chains can be reduced to half or 1/4 of the original length, the delay characteristics of the delay chains are ensured to be consistent, and the problem of differential nonlinearity (DNL) caused by excessively long delay chains is solved.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products