6 results about "Differential nonlinearity" patented technology

This invention discloses a DAC output error correction method based on digital compensation, comprising: collecting amplitude deviation, phase shift, and timing jitter data of the DAC output signal through a quantum sensing DAC calibration and analysis platform to construct a multi-dimensional original error dataset; calling an operational amplifier offset dynamic coupling prediction model to analyze the coupling relationship and extract dynamic correlation features; separating harmonic components and screening error contribution factors based on a broadband DAC harmonic distortion correction model; calculating the gradient change law and extreme point position using a differential nonlinear gradient correction model; integrating the above features and parameters to construct a digital compensation parameter matrix, and dynamically adjusting the output code value through real-time digital modulation to achieve error correction. This method, through multi-model collaborative operation and full-process closed-loop processing, accurately captures the dynamic correlation and distribution characteristics of multi-source errors, achieves synchronous correction of multi-dimensional errors, and improves DAC output accuracy and operating condition adaptability.

The provided is a digital-to-analog conversion circuit based on an R-2R ladder resistor network architecture. The digital-to-analog conversion circuit based on an R-2R ladder resistor network architecture includes: branch resistors, branch switches, bridge resistors, a first compensation resistor, a second compensation resistor and third compensation resistors; specifically, the compensation resistors (the first compensation resistor, the second compensation resistor and the third compensation resistor) are introduced into an R-2R network in a progressive way, a Differential Nonlinearity (DNL) introduced by mismatch between the compensation resistor and on-state impedance of the branch switch may effectively attenuate due to decrease of the resistance of the compensation resistor at a higher branch, even if it may increase with increase of the resistance of the compensation resistor at a lower branch, the lower DNL may attenuate per se, so the overall DNL will decrease.

Provided is a method for measuring a DAC nonlinearity error based on a pseudo-random sequence. The method includes: numbering pseudo-random number values in a pseudo-random sequence to generate a serial number sequence; arranging the pseudo-random number values in the serial number sequence in a descending or ascending order to determine an order random array; sending the pseudo-random number values, as DAC code values, in the order random array to the DAC sequentially; determining a first differential voltage array and a second differential voltage array according to a voltage corresponding to the DAC code values and the DAC code values; and determining a nonlinearity error measurement result of the DAC according to a differential nonlinearity error test result of the DAC and an integral nonlinearity error test result of the DAC determined by the first differential voltage array and the second differential voltage array.

The application relates to an analog-to-digital converter testing system and method. A host computer sends a voltage output instruction to a power supply; when a first indication signal sent by the power supply is received, a sampling start instruction is sent to a device under test, and the first indication signal indicates that the output voltage of the power supply is stable. When it is determined that the device under test is in a sampling completion state, the host computer receives a code value obtained by sampling the output voltage by the device under test in response to the sampling start instruction; based on the code value, a preset analysis algorithm is used to generate a differential nonlinearity parameter and an integral nonlinearity error parameter, and performance detection of the device under test is completed. The application can realize that the device under test samples the established stable output voltage, reduces the code value jump problem when the device under test samples the unstable output voltage, and improves the test precision.

The application discloses a high-precision ADC linearity test method and system, comprising the following steps: inputting a plurality of signal differences to an ADC through a control signal generator, a voltage source, an operator and a channel of a multiplexer, and obtaining a group of output code bits of each signal difference; summing and subtracting two preset signal differences, and summing and subtracting the output code bits of the two preset signal differences, to obtain summing and subtracting results; determining a multivariate linear equation group according to a preset segmented nonlinear model containing a parameter to be solved, the summing and subtracting results and the output code bits; obtaining an optimal solution by solving the equation group, and determining integral nonlinear errors and differential nonlinear errors of the ADC according to the optimal solution and the preset segmented nonlinear model. The application can calculate common-mode and differential-mode of integral nonlinearity and differential nonlinearity, can reduce the precision requirement of an input signal, can greatly shorten test time and sampling points, and has simple system structure, fast algorithm running speed and wide application prospect.

The invention relates to the technical field of data compensation, in particular to a high-precision data compensation method and system. According to the technical scheme, the method comprises the following steps: data acquisition: synchronously acquiring target data and environment parameters, preprocessing the acquired original data to eliminate abnormal values and suppress random noise, and constructing a measurement matrix M and an environment matrix E; error modeling: calculating an integral nonlinear error INL and a differential nonlinear error DNL of the data based on the measurement matrix M, and establishing a nonlinear error fitting function fINL (x); and environment compensation: constructing an error equation containing the environment matrix E. Through organic combination of dynamic self-adaption, multi-source collaboration, intelligent learning and closed-loop control, a data compensation technology is upgraded from a static, isolated and passive traditional mode to a dynamic, collaborative and intelligent advanced mode, the compensation precision is extremely high, and the dynamic response speed and long-term environmental adaptability are excellent.