2 results about "Differential nonlinearity" patented technology

The application discloses a high-precision ADC linearity test method and system, comprising the following steps: inputting a plurality of signal differences to an ADC through a control signal generator, a voltage source, an operator and a channel of a multiplexer, and obtaining a group of output code bits of each signal difference; summing and subtracting two preset signal differences, and summing and subtracting the output code bits of the two preset signal differences, to obtain summing and subtracting results; determining a multivariate linear equation group according to a preset segmented nonlinear model containing a parameter to be solved, the summing and subtracting results and the output code bits; obtaining an optimal solution by solving the equation group, and determining integral nonlinear errors and differential nonlinear errors of the ADC according to the optimal solution and the preset segmented nonlinear model. The application can calculate common-mode and differential-mode of integral nonlinearity and differential nonlinearity, can reduce the precision requirement of an input signal, can greatly shorten test time and sampling points, and has simple system structure, fast algorithm running speed and wide application prospect.

The application relates to an analog-to-digital converter testing system and method. A host computer sends a voltage output instruction to a power supply; when a first indication signal sent by the power supply is received, a sampling start instruction is sent to a device under test, and the first indication signal indicates that the output voltage of the power supply is stable. When it is determined that the device under test is in a sampling completion state, the host computer receives a code value obtained by sampling the output voltage by the device under test in response to the sampling start instruction; based on the code value, a preset analysis algorithm is used to generate a differential nonlinearity parameter and an integral nonlinearity error parameter, and performance detection of the device under test is completed. The application can realize that the device under test samples the established stable output voltage, reduces the code value jump problem when the device under test samples the unstable output voltage, and improves the test precision.