Built self testing unit and method inside D/A converter

Abstract

D / A signal is differentiated through a differential element in order to obtain difference between pulses of analog signals. Based on a threshold voltage, Schmidt triggering unit converts the analog signals to digital signals. Using a duty cycle picker calculates duty cycle of the digital signal, which is sent to a signature analyzer to calculate degree of non-linearity of differential in order to carry out error analysis. In order to treat D / A signal in high speed, a combined circuit including a pattern test unit, a sample-and-hold circuit and a logic circuit is adopted as front-end circuit of differential element to lower speed of D / A signal.

Description

technical field [0001] The present invention relates to a built-in self-test (Built In Self-Test, BIST) device and method, in particular to a built-in self-test applied to a digital-to-analog converter (Digital-to-Analog Converter, DAC) Devices and methods. Background technique [0002] With the development of highly integrated circuits, more and more circuits are integrated into a system-on-chip (SoC). Many digital-to-analog converters, analog-to-digital converters (Analog-to-DigitalConverter, ADC) and mixed-signal (mixed-signal) circuits that combine analog and digital functions have been used in wireless communications, data conversion systems, and satellite communications. . In recent years, the built-in self-test technology has been developed for the above-mentioned circuits, and the built-in circuit can directly test its own hardware, so as to save cost and shorten the test time. [0003] Traditionally, the built-in self-test of the digital-to-analog converter is to...

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Problems solved by technology

[0003] Traditionally, the built-in self-test of the digital-to-analog converter is to directly process the digital-to-analog (DA) voltage signal, but because it is difficult to distinguish between the analog signal and the noise, it is often necessary to add an auxiliary circuit or use a special method to process it. However, the result still not ideal

In addition, if a high-frequency DA signal needs to be processed, a circuit for extracting voltage must be added, and its sampling frequency often needs to be more than twice the frequency of the DA signal, so it is quite technically difficult

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