Built-in self testing device and method of digital analog converter

Abstract

The invention discloses built-in self-detecting device of the digital / analog convertor and the manufacturing method. It mainly differentiates the digital / analog signal with a differential coefficient unit to get the difference between the pulses of analog signal and transforms the analog signal into the digital signal with a Schmidt burst unit according to a critical voltage. Then, it calculates the loading cycle of the digital signal with a load cycle collector and sends it in signature analyzer to calculate the differential coefficient nonlinearity in order to analysis the error.

Description

technical field [0001] The present invention relates to a built-in self-test (BIST) device and method, in particular to a built-in self-test device and method applied to a digital-to-analog converter (DAC). Background technique [0002] With the development of highly integrated circuits, more and more circuits are integrated into a system-on-chip (SoC). Many digital-to-analog converters, analog-to-digital converters (ADCs), and mixed-signal circuits combining analog and digital functions have been used in applications such as wireless communications, data conversion systems, and satellite communications. In recent years, the above-mentioned circuits have developed a built-in self-test technology, which can directly test their own hardware through the built-in circuit, so as to save costs and shorten test time. [0003] Traditionally, the built-in self-test of the digital-to-analog converter is to directly process the digital-to-analog (DA) voltage signal, but because the an...

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Problems solved by technology

[0003] Traditionally, the built-in self-test of the digital-to-analog converter is to directly process the digital-to-analog (DA) voltage signal, but because the analog signal and the noise are not easy to distinguish, it is often necessary to add auxiliary circuits or use special methods for processing, but the result is still not ideal

In addition, if a high-frequency DA signal needs to be processed, a circuit for extracting voltage must be added, and its sampling frequency often needs to be more than twice the frequency of the DA signal, so it is quite technically difficult

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