Memory tester data self-destruct method

A tester and data technology, applied in the protection of internal/peripheral computer components, etc., can solve the problems that are not suitable for the marine environment, cannot be erased and self-destructed, and cannot be received

Active Publication Date: 2021-07-06
ZHONGBEI UNIV
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these two methods of data self-destruction are not suitable for marine environments or missile tests, because once the recorder is lost, if the button is not pressed, it is very likely to cause data leakage. When the tester is beyond the range of wireless telemetry It is almost impossible to receive the data self-destruct command under the condition of the device. In addition, when the battery power failure occurs in the device, the above-mentioned data self-destruction is also impossible to complete.
The self-destruct function of abnormal readings mentioned in Wang Junfeng’s dissertation "Research on Marine Overpressure Parameter Testing Technology" of North University of China is judged based on the number of abnormal readings detected. When the circuit is powered off and then powered on again, multiple test readings can be performed, and the circuit will not automatically erase the recorded data. This method of data self-destruction will have a great potential safety hazard
However, in the actual test, due to the complex test environment of the explosion field, when the test device enters the trigger state, there will be a situation where the power is turned off before reaching the set recording capacity during data collection. In this case, the timing of the recorder will be Will not open, cannot erase and self-destruct the recorded data

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory tester data self-destruct method
  • Memory tester data self-destruct method
  • Memory tester data self-destruct method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] The control chip in the storage tester can be a single-chip microcomputer such as MSP430, and an ARM chip such as STM32; the CPLD can choose a series of chips such as XCR3128, or a series of FPGA chips such as EP4CE10; the FLASH chip can be a series of chips such as K9K8G.

[0016] For the specific process of the timing self-destruct method of data, please refer to figure 1 , figure 1 As the working flow chart of the whole control system, the timing self-destruction method of data will be described in detail below.

[0017] First, after initializing the control chip and CPLD or FPGA in the acquisition memory board circuit, the control chip opens the serial port to receive commands. When the control chip receives the start command, it will set the start flag to 1 in the serial port interrupt program, and the control chip will continuously scan and detect whether the start flag is equal to 1. Once the condition is detected, it will immediately enter the state of cyclic d...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a method for self-destructing data, in particular to a method for self-destructing data of a storage tester. It is mainly composed of three aspects. First, set the data timing self-destruction, wake up the control chip after the timing time is reached, and cooperate with CPLD or FPGA to perform data erasing operation; second, set the abnormal read self-destruction , when the wrong reading command is received for the first time, if the correct command is not input within the specified timing time, the control chip will be woken up, and the data erasing operation will be performed in cooperation with the CPLD or FPGA; third, the battery will be powered off Self-destruction, a battery power-off detection circuit is added to the original acquisition and storage circuit. After confirming that the battery is powered off, the data stored in the memory chip is erased by using the power stored in the energy storage capacitor on the circuit board. The present invention adopts the methods of data timing self-destruction, abnormal reading self-destruction, and data self-destruction quickly after the device is powered off, so as to ensure that when the storage test recorder is lost, or when the battery is manually disassembled or the power is accidentally cut off, the tester Data self-destruction can still be completed without causing data leakage.

Description

technical field [0001] The invention relates to a method for self-destructing data, in particular to a method for self-destructing data of a storage tester. Background technique [0002] The explosion impact test of ships and shipboard equipment at sea is due to the special environment where the ship sinks after the ocean test, the ship and the test device move with the ocean current, it is difficult to salvage, and when there is a fault in the missile test, the aircraft or test device will be damaged. In the special environment tens of kilometers or even hundreds of kilometers away from the predetermined location, the storage test recorder used in the test is easy to lose and difficult to find. Once the recorder is lost, it is very likely to cause the leakage of secret data, which will pose a threat to national defense security . [0003] At present, most data storage testers use a key-press method to destroy data. For example, in the utility model patent "Storage Media De...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06F21/78
CPCG06F21/78
Inventor 丁永红尤文斌王海霞杨磊姚悦马铁华裴东兴范锦彪李新娥张瑜路万里田晓虹张超颖郭晶申飞
Owner ZHONGBEI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products