Structure light three-dimensional imaging method and system for high light reflection object surface

Abstract

The invention provides a structure light three-dimensional imaging method and system for the high light reflection object surface, and relates to the field of three-dimensional measuring. The method comprises the steps that a plurality of binary phase shifting encoding patterns with the same frequency and different illumination intensities are projected to the surface of an object to be measured,according to reflected images, a plurality of modulation picture sets under different illumination intensities are generated, and descending sorting is performed according to the illumination intensities; the illumination saturation intensity for each pixel point in the set with the maximum illumination intensity is obtained, a saturated pixel point is obtained, a saturated region is determined, substitute pixel points with the minimum illumination saturation intensity and the maximum illumination intensity corresponding to saturation pixel points in various other corresponding regions are obtained, phases are calculated, the phases of the substitute pixels are used for replacing phases of the saturation pixel points, and a repaired three-dimensional image of the object to be measured is obtained. The problem that when three-dimensional rebuilding is performed on a high light reflection object, phase errors are caused due to excessively-high reflection rate and saturation light intensity is effectively solved, the rebuilding speed is high, the accuracy is high.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement, in particular to a structured light three-dimensional imaging method and system for the surface of a highly reflective object. Background technique [0002] At present, as a 3D reconstruction technology based on structured light measurement technology, Phase Measurement Profilometry (PMP) is widely used in 3D modeling, industrial manufacturing, product Quality inspection, biometrics and other fields. [0003] In the practical application of phase measurement profilometry, it is necessary for the camera to accurately obtain the reflected light when the encoded pattern is projected on the surface of the measured object as the basis for solving the phase. Due to the smooth surface and high reflectivity of highly reflective objects, the light intensity of pixels in some areas with extremely high light intensity in the captured picture is limited to the maximum quantization value of the c...

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Problems solved by technology

[0005] In view of this, the embodiment of the present invention provides a structured light three-dimensional imaging method and system for the surface of a highly reflective object, which is used to solve the problems of information distortion and measurement accuracy reduction caused by saturated light intensity of captured pictures in three-dimensional measurement

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